Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2013
|
| Ausgabe: | 1. ed. |
| Schriftenreihe: | Micro & nano technologies
|
| Schlagworte: | |
| Online-Zugang: | UBR01 Volltext |
| Beschreibung: | Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website |
| Beschreibung: | 1 Online-Ressource (xii, 320 pages) |
| ISBN: | 9781455730599 1455730599 9781455730582 1455730580 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042315067 | ||
| 003 | DE-604 | ||
| 005 | 20161006 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150129s2013 |||| o||u| ||||||eng d | ||
| 020 | |a 9781455730599 |c electronic bk. |9 978-1-4557-3059-9 | ||
| 020 | |a 1455730599 |c electronic bk. |9 1-4557-3059-9 | ||
| 020 | |a 9781455730582 |c electronic bk. |9 978-1-4557-3058-2 | ||
| 020 | |a 1455730580 |c electronic bk. |9 1-4557-3058-0 | ||
| 035 | |a (OCoLC)823724127 | ||
| 035 | |a (DE-599)BVBBV042315067 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 |a DE-355 | ||
| 082 | 0 | |a 620.5 | |
| 100 | 1 | |a Klapetek, Petr |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Quantitative Data Processing in Scanning Probe Microscopy |b SPM Applications for Nanometrology |
| 250 | |a 1. ed. | ||
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2013 | |
| 300 | |a 1 Online-Ressource (xii, 320 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Micro & nano technologies | |
| 500 | |a Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website | ||
| 650 | 7 | |a SCIENCE / Nanoscience |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. |2 bisacsh | |
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Scanning probe microscopy |x Data processing | |
| 650 | 4 | |a Qualitative research |x Data processing | |
| 650 | 4 | |a Scanning probe microscopy | |
| 650 | 0 | 7 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9781455730582 |x Verlag |3 Volltext |
| 912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
| 940 | 1 | |q FAW_PDA_ESD | |
| 940 | 1 | |q FLA_PDA_ESD | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027752058 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://site.ebrary.com/lib/uniregensburg/docDetail.action?docID=10632121 |l UBR01 |p ebook |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804152908822872064 |
|---|---|
| any_adam_object | |
| author | Klapetek, Petr |
| author_facet | Klapetek, Petr |
| author_role | aut |
| author_sort | Klapetek, Petr |
| author_variant | p k pk |
| building | Verbundindex |
| bvnumber | BV042315067 |
| collection | ZDB-33-ESD ZDB-33-EBS |
| ctrlnum | (OCoLC)823724127 (DE-599)BVBBV042315067 |
| dewey-full | 620.5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.5 |
| dewey-search | 620.5 |
| dewey-sort | 3620.5 |
| dewey-tens | 620 - Engineering and allied operations |
| edition | 1. ed. |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03521nmm a2200517zc 4500</leader><controlfield tag="001">BV042315067</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20161006 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150129s2013 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781455730599</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-4557-3059-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1455730599</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">1-4557-3059-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781455730582</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-4557-3058-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1455730580</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">1-4557-3058-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)823724127</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042315067</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-355</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.5</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Klapetek, Petr</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Quantitative Data Processing in Scanning Probe Microscopy</subfield><subfield code="b">SPM Applications for Nanometrology</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xii, 320 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Micro & nano technologies</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Nanoscience</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning probe microscopy</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Qualitative research</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning probe microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9781455730582</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FAW_PDA_ESD</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FLA_PDA_ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027752058</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://site.ebrary.com/lib/uniregensburg/docDetail.action?docID=10632121</subfield><subfield code="l">UBR01</subfield><subfield code="p">ebook</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV042315067 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:11Z |
| institution | BVB |
| isbn | 9781455730599 1455730599 9781455730582 1455730580 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027752058 |
| oclc_num | 823724127 |
| open_access_boolean | |
| owner | DE-1046 DE-355 DE-BY-UBR |
| owner_facet | DE-1046 DE-355 DE-BY-UBR |
| physical | 1 Online-Ressource (xii, 320 pages) |
| psigel | ZDB-33-ESD ZDB-33-EBS FAW_PDA_ESD FLA_PDA_ESD ebook |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Micro & nano technologies |
| spelling | Klapetek, Petr Verfasser aut Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology 1. ed. Amsterdam [u.a.] Elsevier 2013 1 Online-Ressource (xii, 320 pages) txt rdacontent c rdamedia cr rdacarrier Micro & nano technologies Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website SCIENCE / Nanoscience bisacsh TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Datenverarbeitung Scanning probe microscopy Data processing Qualitative research Data processing Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s 1\p DE-604 http://www.sciencedirect.com/science/book/9781455730582 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Klapetek, Petr Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology SCIENCE / Nanoscience bisacsh TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Datenverarbeitung Scanning probe microscopy Data processing Qualitative research Data processing Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_auth | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_exact_search | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_full | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_fullStr | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_full_unstemmed | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_short | Quantitative Data Processing in Scanning Probe Microscopy |
| title_sort | quantitative data processing in scanning probe microscopy spm applications for nanometrology |
| title_sub | SPM Applications for Nanometrology |
| topic | SCIENCE / Nanoscience bisacsh TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Datenverarbeitung Scanning probe microscopy Data processing Qualitative research Data processing Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | SCIENCE / Nanoscience TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. Datenverarbeitung Scanning probe microscopy Data processing Qualitative research Data processing Scanning probe microscopy Rastersondenmikroskopie |
| url | http://www.sciencedirect.com/science/book/9781455730582 |
| work_keys_str_mv | AT klapetekpetr quantitativedataprocessinginscanningprobemicroscopyspmapplicationsfornanometrology |