APA (7th ed.) Citation

International Conference on the Science and Technology of Defect Control in Semiconductors <1989, Yokohama-shi, Japan>. (1990). Defect control in semiconductors, Vol. 2: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. North-Holland.

Chicago Style (17th ed.) Citation

International Conference on the Science and Technology of Defect Control in Semiconductors <1989, Yokohama-shi, Japan>. Defect Control in Semiconductors, Vol. 2: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. Amsterdam: North-Holland, 1990.

MLA (9th ed.) Citation

International Conference on the Science and Technology of Defect Control in Semiconductors <1989, Yokohama-shi, Japan>. Defect Control in Semiconductors, Vol. 2: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. North-Holland, 1990.