Defect control in semiconductors, Vol. 2: proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989
Gespeichert in:
| Körperschaft: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
North-Holland
1990
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| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and indexes Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below |
| Beschreibung: | 1 Online-Ressource (/ ill) |
| ISBN: | 0444884297 9780444884299 |
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| spelling | International Conference on the Science and Technology of Defect Control in Semiconductors <1989, Yokohama-shi, Japan> Verfasser aut Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 edited by K. Sumino Amsterdam North-Holland 1990 1 Online-Ressource (/ ill) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and indexes Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below Conference proceedings fast Materials / Defects fast Semiconductors / Defects fast Semiconductors Defects Congresses Materials Defects Congresses (DE-588)1071861417 Konferenzschrift gnd-content Sumino, K. Sonstige oth http://www.sciencedirect.com/science/book/9780444884299 Verlag Volltext |
| spellingShingle | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 Conference proceedings fast Materials / Defects fast Semiconductors / Defects fast Semiconductors Defects Congresses Materials Defects Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 |
| title_auth | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 |
| title_exact_search | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 |
| title_full | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 edited by K. Sumino |
| title_fullStr | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 edited by K. Sumino |
| title_full_unstemmed | Defect control in semiconductors, Vol. 2 proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 edited by K. Sumino |
| title_short | Defect control in semiconductors, Vol. 2 |
| title_sort | defect control in semiconductors vol 2 proceedings of the international conference on the science and technology of defect control in semiconductors the yokohama 21st century forum yokohama japan september 17 22 1989 |
| title_sub | proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 |
| topic | Conference proceedings fast Materials / Defects fast Semiconductors / Defects fast Semiconductors Defects Congresses Materials Defects Congresses |
| topic_facet | Conference proceedings Materials / Defects Semiconductors / Defects Semiconductors Defects Congresses Materials Defects Congresses Konferenzschrift |
| url | http://www.sciencedirect.com/science/book/9780444884299 |
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