Ion beams for materials analysis:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Sydney
Academic Press
c1989
|
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on |
| Beschreibung: | 1 Online-Ressource (xviii, 719 p.) |
| ISBN: | 0080916899 0120997401 9780080916897 9780120997404 |
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| 500 | |a The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on | ||
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| dewey-ones | 539 - Modern physics |
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| dewey-search | 539.73 |
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| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
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| id | DE-604.BV042310894 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:03Z |
| institution | BVB |
| isbn | 0080916899 0120997401 9780080916897 9780120997404 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027747886 |
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| physical | 1 Online-Ressource (xviii, 719 p.) |
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| publishDate | 1989 |
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| publisher | Academic Press |
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| spelling | Ion beams for materials analysis edited by J.R. Bird and J.S. Williams Sydney Academic Press c1989 1 Online-Ressource (xviii, 719 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on Ionenstrahl swd Sekundärionen-Massenspektrometrie swd Werkstoffprüfung swd SCIENCE / Physics / Nuclear bisacsh Ion bombardment fast Materials / Analysis fast Ion bombardment Materials Analysis Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 s Ionenstrahl (DE-588)4162347-2 s 1\p DE-604 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s 2\p DE-604 Bird, J. R. Sonstige oth Williams, James S. Sonstige oth http://www.sciencedirect.com/science/book/9780120997404 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Ion beams for materials analysis Ionenstrahl swd Sekundärionen-Massenspektrometrie swd Werkstoffprüfung swd SCIENCE / Physics / Nuclear bisacsh Ion bombardment fast Materials / Analysis fast Ion bombardment Materials Analysis Werkstoffprüfung (DE-588)4037934-6 gnd Ionenstrahl (DE-588)4162347-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4037934-6 (DE-588)4162347-2 (DE-588)4077346-2 |
| title | Ion beams for materials analysis |
| title_auth | Ion beams for materials analysis |
| title_exact_search | Ion beams for materials analysis |
| title_full | Ion beams for materials analysis edited by J.R. Bird and J.S. Williams |
| title_fullStr | Ion beams for materials analysis edited by J.R. Bird and J.S. Williams |
| title_full_unstemmed | Ion beams for materials analysis edited by J.R. Bird and J.S. Williams |
| title_short | Ion beams for materials analysis |
| title_sort | ion beams for materials analysis |
| topic | Ionenstrahl swd Sekundärionen-Massenspektrometrie swd Werkstoffprüfung swd SCIENCE / Physics / Nuclear bisacsh Ion bombardment fast Materials / Analysis fast Ion bombardment Materials Analysis Werkstoffprüfung (DE-588)4037934-6 gnd Ionenstrahl (DE-588)4162347-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Ionenstrahl Sekundärionen-Massenspektrometrie Werkstoffprüfung SCIENCE / Physics / Nuclear Ion bombardment Materials / Analysis Materials Analysis |
| url | http://www.sciencedirect.com/science/book/9780120997404 |
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