C, H, N and O in Si and Characterization and Simulation of Materials and Processes: Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Gespeichert in:
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Oxford
Elsevier Science
1996
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| Schriftenreihe: | European Materials Research Society symposia proceedings
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| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | 2. Experimental procedure Containing over 200 papers, this volume contains the proceedings of two symposia in the E-MRS series. Part I presents a state of the art review of the topic - Carbon, Hydrogen, Nitrogen and Oxygen in Silicon and in Other Elemental Semiconductors. There was strong representation from the industrial laboratories, illustrating that the topic is highly relevant for the semiconductor industry. The second part of the volume deals with a topic which is undergoing a process of convergence with two concerns that are more particularly application oriented. Firstly, the advanced instrumentation which |
| Beschreibung: | 1 Online-Ressource (580 pages) |
| ISBN: | 044459633X 9780444596338 |
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| spelling | Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors <1995, Strasbourg, France> Verfasser aut C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 edited by A. Borghesi [and others] Oxford Elsevier Science 1996 1 Online-Ressource (580 pages) txt rdacontent c rdamedia cr rdacarrier European Materials Research Society symposia proceedings 2. Experimental procedure Containing over 200 papers, this volume contains the proceedings of two symposia in the E-MRS series. Part I presents a state of the art review of the topic - Carbon, Hydrogen, Nitrogen and Oxygen in Silicon and in Other Elemental Semiconductors. There was strong representation from the industrial laboratories, illustrating that the topic is highly relevant for the semiconductor industry. The second part of the volume deals with a topic which is undergoing a process of convergence with two concerns that are more particularly application oriented. Firstly, the advanced instrumentation which Conference proceedings fast Compound semiconductors Compound semiconductors / Congresses Compound semiconductors / Industrial applications / Congresses Congreses Congresses Mathematical models Nanostructure materials Semiconductors / Design and construction / Congresses Semiconductors / Mathematical models / Congresses Semiconductors / Simulation methods / Congresses Silicon crystals TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Semiconductors fast Semiconductors / Defects fast Silicon fast Mathematisches Modell Semiconductors Congresses Silicon Congresses Semiconductors Defects Congresses (DE-588)1071861417 Konferenzschrift gnd-content Borghesi, A. Sonstige oth Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes <1995, Strasbourg, France> Sonstige oth http://www.sciencedirect.com/science/book/9780444824134 Verlag Volltext |
| spellingShingle | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 Conference proceedings fast Compound semiconductors Compound semiconductors / Congresses Compound semiconductors / Industrial applications / Congresses Congreses Congresses Mathematical models Nanostructure materials Semiconductors / Design and construction / Congresses Semiconductors / Mathematical models / Congresses Semiconductors / Simulation methods / Congresses Silicon crystals TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Semiconductors fast Semiconductors / Defects fast Silicon fast Mathematisches Modell Semiconductors Congresses Silicon Congresses Semiconductors Defects Congresses |
| subject_GND | (DE-588)1071861417 |
| title | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 |
| title_auth | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 |
| title_exact_search | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 |
| title_full | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 edited by A. Borghesi [and others] |
| title_fullStr | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 edited by A. Borghesi [and others] |
| title_full_unstemmed | C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 edited by A. Borghesi [and others] |
| title_short | C, H, N and O in Si and Characterization and Simulation of Materials and Processes |
| title_sort | c h n and o in si and characterization and simulation of materials and processes proceedings of symposium n and symposium g of the 1995 e mrs spring conference held in strasbourg france 22 26 may 1995 |
| title_sub | Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 |
| topic | Conference proceedings fast Compound semiconductors Compound semiconductors / Congresses Compound semiconductors / Industrial applications / Congresses Congreses Congresses Mathematical models Nanostructure materials Semiconductors / Design and construction / Congresses Semiconductors / Mathematical models / Congresses Semiconductors / Simulation methods / Congresses Silicon crystals TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Semiconductors fast Semiconductors / Defects fast Silicon fast Mathematisches Modell Semiconductors Congresses Silicon Congresses Semiconductors Defects Congresses |
| topic_facet | Conference proceedings Compound semiconductors Compound semiconductors / Congresses Compound semiconductors / Industrial applications / Congresses Congreses Congresses Mathematical models Nanostructure materials Semiconductors / Design and construction / Congresses Semiconductors / Mathematical models / Congresses Semiconductors / Simulation methods / Congresses Silicon crystals TECHNOLOGY & ENGINEERING / Electronics / Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State Semiconductors Semiconductors / Defects Silicon Mathematisches Modell Semiconductors Congresses Silicon Congresses Semiconductors Defects Congresses Konferenzschrift |
| url | http://www.sciencedirect.com/science/book/9780444824134 |
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