Computed electron micrographs and defect identification:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
North-Holland Pub. Co.
1973
|
| Schriftenreihe: | Defects in crystalline solids
v. 7 |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references (p. [387]-389) |
| Beschreibung: | 1 Online-Ressource (x, 400 pages with illustrations) |
| ISBN: | 0444104623 0444601473 0720417570 9780444104625 9780444601476 9780720417579 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV042310816 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150129s1973 |||| o||u| ||||||eng d | ||
| 020 | |a 0444104623 |c American Elsevier |9 0-444-10462-3 | ||
| 020 | |a 0444601473 |c electronic bk. |9 0-444-60147-3 | ||
| 020 | |a 0720417570 |c electronic bk. |9 0-7204-1757-0 | ||
| 020 | |a 9780444104625 |c American Elsevier |9 978-0-444-10462-5 | ||
| 020 | |a 9780444601476 |c electronic bk. |9 978-0-444-60147-6 | ||
| 020 | |a 9780720417579 |c electronic bk. |9 978-0-7204-1757-9 | ||
| 035 | |a (OCoLC)651721187 | ||
| 035 | |a (DE-599)BVBBV042310816 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 548/.83 |2 18eng | |
| 082 | 0 | |a 548/.842/02854 | |
| 245 | 1 | 0 | |a Computed electron micrographs and defect identification |c By A.K. Head, P. Humble, L.M. Clarebrough, a.o |
| 264 | 1 | |a Amsterdam |b North-Holland Pub. Co. |c 1973 | |
| 300 | |a 1 Online-Ressource (x, 400 pages with illustrations) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Defects in crystalline solids |v v. 7 | |
| 500 | |a Includes bibliographical references (p. [387]-389) | ||
| 650 | 4 | |a physique | |
| 650 | 4 | |a identification défaut | |
| 650 | 4 | |a cristallographie | |
| 650 | 4 | |a dislocation | |
| 650 | 4 | |a diffraction | |
| 650 | 4 | |a Cristaux / Défauts | |
| 650 | 4 | |a Électrons / Diffraction | |
| 650 | 4 | |a Cristallographie / Informatique | |
| 650 | 7 | |a SCIENCE / Physics / Crystallography |2 bisacsh | |
| 650 | 7 | |a Electron microscopy / Data processing |2 fast | |
| 650 | 7 | |a Metals / Defects / Data processing |2 fast | |
| 650 | 7 | |a Roosterfouten |2 gtt | |
| 650 | 7 | |a Vastestoffysica |2 gtt | |
| 650 | 7 | |a Elektronendiffractie |2 gtt | |
| 650 | 7 | |a Elektronenmicroscopie |2 gtt | |
| 650 | 7 | |a Computersimulaties |2 gtt | |
| 650 | 7 | |a Metall |2 swd | |
| 650 | 7 | |a Mikrostruktur |2 swd | |
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Metals |x Defects |x Data processing | |
| 650 | 4 | |a Electron microscopy |x Data processing | |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | 1 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Head, A. K. |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780720417579 |x Verlag |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027747808 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://www.sciencedirect.com/science/book/9780720417579 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804152899939336192 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV042310816 |
| collection | ZDB-33-ESD |
| ctrlnum | (OCoLC)651721187 (DE-599)BVBBV042310816 |
| dewey-full | 548/.83 548/.842/02854 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548/.83 548/.842/02854 |
| dewey-search | 548/.83 548/.842/02854 |
| dewey-sort | 3548 283 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02773nmm a2200721zcb4500</leader><controlfield tag="001">BV042310816</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150129s1973 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0444104623</subfield><subfield code="c">American Elsevier</subfield><subfield code="9">0-444-10462-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0444601473</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-444-60147-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0720417570</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-7204-1757-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780444104625</subfield><subfield code="c">American Elsevier</subfield><subfield code="9">978-0-444-10462-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780444601476</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-444-60147-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780720417579</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-7204-1757-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)651721187</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042310816</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">548/.83</subfield><subfield code="2">18eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">548/.842/02854</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Computed electron micrographs and defect identification</subfield><subfield code="c">By A.K. Head, P. Humble, L.M. Clarebrough, a.o</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">North-Holland Pub. Co.</subfield><subfield code="c">1973</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (x, 400 pages with illustrations)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Defects in crystalline solids</subfield><subfield code="v">v. 7</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. [387]-389)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">physique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">identification défaut</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">cristallographie</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">dislocation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">diffraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Cristaux / Défauts</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Électrons / Diffraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Cristallographie / Informatique</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Crystallography</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron microscopy / Data processing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Metals / Defects / Data processing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Roosterfouten</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Vastestoffysica</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Elektronendiffractie</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Elektronenmicroscopie</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Computersimulaties</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Metall</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Mikrostruktur</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metals</subfield><subfield code="x">Defects</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Head, A. K.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780720417579</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027747808</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/book/9780720417579</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV042310816 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:03Z |
| institution | BVB |
| isbn | 0444104623 0444601473 0720417570 9780444104625 9780444601476 9780720417579 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027747808 |
| oclc_num | 651721187 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 Online-Ressource (x, 400 pages with illustrations) |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1973 |
| publishDateSearch | 1973 |
| publishDateSort | 1973 |
| publisher | North-Holland Pub. Co. |
| record_format | marc |
| series2 | Defects in crystalline solids |
| spelling | Computed electron micrographs and defect identification By A.K. Head, P. Humble, L.M. Clarebrough, a.o Amsterdam North-Holland Pub. Co. 1973 1 Online-Ressource (x, 400 pages with illustrations) txt rdacontent c rdamedia cr rdacarrier Defects in crystalline solids v. 7 Includes bibliographical references (p. [387]-389) physique identification défaut cristallographie dislocation diffraction Cristaux / Défauts Électrons / Diffraction Cristallographie / Informatique SCIENCE / Physics / Crystallography bisacsh Electron microscopy / Data processing fast Metals / Defects / Data processing fast Roosterfouten gtt Vastestoffysica gtt Elektronendiffractie gtt Elektronenmicroscopie gtt Computersimulaties gtt Metall swd Mikrostruktur swd Datenverarbeitung Metals Defects Data processing Electron microscopy Data processing Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 s Elektronenmikroskopie (DE-588)4014327-2 s 1\p DE-604 Head, A. K. Sonstige oth http://www.sciencedirect.com/science/book/9780720417579 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Computed electron micrographs and defect identification physique identification défaut cristallographie dislocation diffraction Cristaux / Défauts Électrons / Diffraction Cristallographie / Informatique SCIENCE / Physics / Crystallography bisacsh Electron microscopy / Data processing fast Metals / Defects / Data processing fast Roosterfouten gtt Vastestoffysica gtt Elektronendiffractie gtt Elektronenmicroscopie gtt Computersimulaties gtt Metall swd Mikrostruktur swd Datenverarbeitung Metals Defects Data processing Electron microscopy Data processing Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4014327-2 |
| title | Computed electron micrographs and defect identification |
| title_auth | Computed electron micrographs and defect identification |
| title_exact_search | Computed electron micrographs and defect identification |
| title_full | Computed electron micrographs and defect identification By A.K. Head, P. Humble, L.M. Clarebrough, a.o |
| title_fullStr | Computed electron micrographs and defect identification By A.K. Head, P. Humble, L.M. Clarebrough, a.o |
| title_full_unstemmed | Computed electron micrographs and defect identification By A.K. Head, P. Humble, L.M. Clarebrough, a.o |
| title_short | Computed electron micrographs and defect identification |
| title_sort | computed electron micrographs and defect identification |
| topic | physique identification défaut cristallographie dislocation diffraction Cristaux / Défauts Électrons / Diffraction Cristallographie / Informatique SCIENCE / Physics / Crystallography bisacsh Electron microscopy / Data processing fast Metals / Defects / Data processing fast Roosterfouten gtt Vastestoffysica gtt Elektronendiffractie gtt Elektronenmicroscopie gtt Computersimulaties gtt Metall swd Mikrostruktur swd Datenverarbeitung Metals Defects Data processing Electron microscopy Data processing Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | physique identification défaut cristallographie dislocation diffraction Cristaux / Défauts Électrons / Diffraction Cristallographie / Informatique SCIENCE / Physics / Crystallography Electron microscopy / Data processing Metals / Defects / Data processing Roosterfouten Vastestoffysica Elektronendiffractie Elektronenmicroscopie Computersimulaties Metall Mikrostruktur Datenverarbeitung Metals Defects Data processing Electron microscopy Data processing Gitterbaufehler Elektronenmikroskopie |
| url | http://www.sciencedirect.com/science/book/9780720417579 |
| work_keys_str_mv | AT headak computedelectronmicrographsanddefectidentification |