Reliability prediction from burn-in data fit to reliability models:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Academic Press
2014
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions |
| Beschreibung: | 1 Online-Ressource (108 pages) |
| ISBN: | 9780128008195 0128008199 1306490383 9781306490382 9780128007471 |
Internformat
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Datensatz im Suchindex
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| discipline | Informatik |
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| id | DE-604.BV042309757 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:01Z |
| institution | BVB |
| isbn | 9780128008195 0128008199 1306490383 9781306490382 9780128007471 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027746749 |
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| physical | 1 Online-Ressource (108 pages) |
| psigel | ZDB-33-ESD ZDB-33-EBS FAW_PDA_ESD |
| publishDate | 2014 |
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| publisher | Academic Press |
| record_format | marc |
| spelling | Bernstein, Joseph Verfasser aut Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein London Academic Press 2014 1 Online-Ressource (108 pages) txt rdacontent c rdamedia cr rdacarrier This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) fast Reliability (Engineering) http://www.sciencedirect.com/science/book/9780128007471 Verlag Volltext |
| spellingShingle | Bernstein, Joseph Reliability prediction from burn-in data fit to reliability models Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) fast Reliability (Engineering) |
| title | Reliability prediction from burn-in data fit to reliability models |
| title_auth | Reliability prediction from burn-in data fit to reliability models |
| title_exact_search | Reliability prediction from burn-in data fit to reliability models |
| title_full | Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein |
| title_fullStr | Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein |
| title_full_unstemmed | Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein |
| title_short | Reliability prediction from burn-in data fit to reliability models |
| title_sort | reliability prediction from burn in data fit to reliability models |
| topic | Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) fast Reliability (Engineering) |
| topic_facet | Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) |
| url | http://www.sciencedirect.com/science/book/9780128007471 |
| work_keys_str_mv | AT bernsteinjoseph reliabilitypredictionfromburnindatafittoreliabilitymodels |