Digital circuit testing: a guide to DFT and other techniques
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
San Diego
Academic Press
c1991
|
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index "Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods"--Provided by publisher |
| Beschreibung: | 1 Online-Ressource (xi, 233 p.) |
| ISBN: | 0080504345 9780080504346 |
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| 100 | 1 | |a Wang, Francis C. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Digital circuit testing |b a guide to DFT and other techniques |c Francis C. Wang |
| 264 | 1 | |a San Diego |b Academic Press |c c1991 | |
| 300 | |a 1 Online-Ressource (xi, 233 p.) | ||
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| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a "Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods"--Provided by publisher | ||
| 650 | 4 | |a Test circuit intégré | |
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| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |2 bisacsh | |
| 650 | 7 | |a Digital integrated circuits / Testing |2 fast | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
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Datensatz im Suchindex
| _version_ | 1804152895819481088 |
|---|---|
| any_adam_object | |
| author | Wang, Francis C. |
| author_facet | Wang, Francis C. |
| author_role | aut |
| author_sort | Wang, Francis C. |
| author_variant | f c w fc fcw |
| building | Verbundindex |
| bvnumber | BV042308934 |
| collection | ZDB-33-ESD |
| ctrlnum | (OCoLC)842936541 (DE-599)BVBBV042308934 |
| dewey-full | 621.381/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/5 |
| dewey-search | 621.381/5 |
| dewey-sort | 3621.381 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV042308934 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:17:59Z |
| institution | BVB |
| isbn | 0080504345 9780080504346 |
| language | English |
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| publishDate | 1991 |
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| publisher | Academic Press |
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| spelling | Wang, Francis C. Verfasser aut Digital circuit testing a guide to DFT and other techniques Francis C. Wang San Diego Academic Press c1991 1 Online-Ressource (xi, 233 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index "Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods"--Provided by publisher Test circuit intégré Circuits intégrés numériques / Essais Circuits intégrés numériques ram Test circuit intégré ram Digitalschaltung swd Testen swd TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Digital integrated circuits / Testing fast Digital integrated circuits Testing Digitalschaltung (DE-588)4012295-5 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Digitalschaltung (DE-588)4012295-5 s Testen (DE-588)4367264-4 s 1\p DE-604 Erscheint auch als Druck-Ausgabe, Hardcover 0-12-734580-9 Erscheint auch als Druck-Ausgabe, Hardcover 978-0-12-734580-2 http://www.sciencedirect.com/science/book/9780127345802 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wang, Francis C. Digital circuit testing a guide to DFT and other techniques Test circuit intégré Circuits intégrés numériques / Essais Circuits intégrés numériques ram Test circuit intégré ram Digitalschaltung swd Testen swd TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Digital integrated circuits / Testing fast Digital integrated circuits Testing Digitalschaltung (DE-588)4012295-5 gnd Testen (DE-588)4367264-4 gnd |
| subject_GND | (DE-588)4012295-5 (DE-588)4367264-4 |
| title | Digital circuit testing a guide to DFT and other techniques |
| title_auth | Digital circuit testing a guide to DFT and other techniques |
| title_exact_search | Digital circuit testing a guide to DFT and other techniques |
| title_full | Digital circuit testing a guide to DFT and other techniques Francis C. Wang |
| title_fullStr | Digital circuit testing a guide to DFT and other techniques Francis C. Wang |
| title_full_unstemmed | Digital circuit testing a guide to DFT and other techniques Francis C. Wang |
| title_short | Digital circuit testing |
| title_sort | digital circuit testing a guide to dft and other techniques |
| title_sub | a guide to DFT and other techniques |
| topic | Test circuit intégré Circuits intégrés numériques / Essais Circuits intégrés numériques ram Test circuit intégré ram Digitalschaltung swd Testen swd TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Digital integrated circuits / Testing fast Digital integrated circuits Testing Digitalschaltung (DE-588)4012295-5 gnd Testen (DE-588)4367264-4 gnd |
| topic_facet | Test circuit intégré Circuits intégrés numériques / Essais Circuits intégrés numériques Digitalschaltung Testen TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Digital integrated circuits / Testing Digital integrated circuits Testing |
| url | http://www.sciencedirect.com/science/book/9780127345802 |
| work_keys_str_mv | AT wangfrancisc digitalcircuittestingaguidetodftandothertechniques |