Problem solving with microbeam analysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier
1988
|
| Schriftenreihe: | Studies in analytical chemistry
7 |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments. The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques |
| Beschreibung: | 1 Online-Ressource (409 pages) |
| ISBN: | 0444419446 0444597476 0444989498 9780444419446 9780444597472 9780444989499 |
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Datensatz im Suchindex
| _version_ | 1804152887316578304 |
|---|---|
| any_adam_object | |
| author | Kiss, Klara |
| author_facet | Kiss, Klara |
| author_role | aut |
| author_sort | Kiss, Klara |
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| building | Verbundindex |
| bvnumber | BV042304831 |
| collection | ZDB-33-ESD |
| ctrlnum | (OCoLC)610190055 (DE-599)BVBBV042304831 |
| dewey-full | 620.1/1295 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1295 |
| dewey-search | 620.1/1295 |
| dewey-sort | 3620.1 41295 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
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| id | DE-604.BV042304831 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:17:51Z |
| institution | BVB |
| isbn | 0444419446 0444597476 0444989498 9780444419446 9780444597472 9780444989499 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027741823 |
| oclc_num | 610190055 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 Online-Ressource (409 pages) |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Studies in analytical chemistry |
| spelling | Kiss, Klara Verfasser aut Problem solving with microbeam analysis Klara Kiss Amsterdam Elsevier 1988 1 Online-Ressource (409 pages) txt rdacontent c rdamedia cr rdacarrier Studies in analytical chemistry 7 Includes bibliographical references and index This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments. The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques Microprobe analysis TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Electron microscopy fast Microprobe analysis fast Mikroanalyse swd Mikroskopie swd Elektronenmikroskopie swd Sekundärionen-Massenspektrometrie swd Electron microscopy Optische Messung (DE-588)4121429-8 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Analytische Chemie (DE-588)4129906-1 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Strahlung (DE-588)4057849-5 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s Elektronenmikroskopie (DE-588)4014327-2 s 1\p DE-604 Mikroskopie (DE-588)4039238-7 s 2\p DE-604 Strahlung (DE-588)4057849-5 s 3\p DE-604 Spektroskopie (DE-588)4056138-0 s 4\p DE-604 Optische Messung (DE-588)4121429-8 s 5\p DE-604 Analytische Chemie (DE-588)4129906-1 s 6\p DE-604 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s 7\p DE-604 http://www.sciencedirect.com/science/book/9780444989499 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Kiss, Klara Problem solving with microbeam analysis Microprobe analysis TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Electron microscopy fast Microprobe analysis fast Mikroanalyse swd Mikroskopie swd Elektronenmikroskopie swd Sekundärionen-Massenspektrometrie swd Electron microscopy Optische Messung (DE-588)4121429-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Analytische Chemie (DE-588)4129906-1 gnd Spektroskopie (DE-588)4056138-0 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Strahlung (DE-588)4057849-5 gnd Mikroanalyse (DE-588)4169804-6 gnd Mikroskopie (DE-588)4039238-7 gnd |
| subject_GND | (DE-588)4121429-8 (DE-588)4014327-2 (DE-588)4129906-1 (DE-588)4056138-0 (DE-588)4077346-2 (DE-588)4057849-5 (DE-588)4169804-6 (DE-588)4039238-7 |
| title | Problem solving with microbeam analysis |
| title_auth | Problem solving with microbeam analysis |
| title_exact_search | Problem solving with microbeam analysis |
| title_full | Problem solving with microbeam analysis Klara Kiss |
| title_fullStr | Problem solving with microbeam analysis Klara Kiss |
| title_full_unstemmed | Problem solving with microbeam analysis Klara Kiss |
| title_short | Problem solving with microbeam analysis |
| title_sort | problem solving with microbeam analysis |
| topic | Microprobe analysis TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Electron microscopy fast Microprobe analysis fast Mikroanalyse swd Mikroskopie swd Elektronenmikroskopie swd Sekundärionen-Massenspektrometrie swd Electron microscopy Optische Messung (DE-588)4121429-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Analytische Chemie (DE-588)4129906-1 gnd Spektroskopie (DE-588)4056138-0 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Strahlung (DE-588)4057849-5 gnd Mikroanalyse (DE-588)4169804-6 gnd Mikroskopie (DE-588)4039238-7 gnd |
| topic_facet | Microprobe analysis TECHNOLOGY & ENGINEERING / Engineering (General) TECHNOLOGY & ENGINEERING / Reference Electron microscopy Mikroanalyse Mikroskopie Elektronenmikroskopie Sekundärionen-Massenspektrometrie Optische Messung Analytische Chemie Spektroskopie Strahlung |
| url | http://www.sciencedirect.com/science/book/9780444989499 |
| work_keys_str_mv | AT kissklara problemsolvingwithmicrobeamanalysis |