The physics of SiO₂ and its interfaces: proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
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Bibliographic Details
Corporate Author: International Topical Conference on the Physics of SiO₂ and Its Interfaces <1978, Yorktown Heights, N.Y.> (Author)
Format: Electronic eBook
Language:English
Published: New York Pergamon Press ©1978
Subjects:
Online Access:FAW01
Volltext
Item Description:Includes bibliographical references and index
Physical Description:1 Online-Ressource (xi, 488 pages)
ISBN:0080230490
9780080230498

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