International Topical Conference on the Physics of SiO₂ and Its Interfaces <1978, Yorktown Heights, N.Y.>. (1978). The physics of SiO₂ and its interfaces: Proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978. Pergamon Press.
Chicago Style (17th ed.) CitationInternational Topical Conference on the Physics of SiO₂ and Its Interfaces <1978, Yorktown Heights, N.Y.>. The Physics of SiO₂ and Its Interfaces: Proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, Held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978. New York: Pergamon Press, 1978.
MLA (9th ed.) CitationInternational Topical Conference on the Physics of SiO₂ and Its Interfaces <1978, Yorktown Heights, N.Y.>. The Physics of SiO₂ and Its Interfaces: Proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, Held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978. Pergamon Press, 1978.