X-Ray absorption spectroscopy of semiconductors:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2015
|
| Schriftenreihe: | Springer Series in Optical Sciences
190 |
| Schlagworte: | |
| Online-Zugang: | TUM01 UBT01 Volltext |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9783662443620 |
| DOI: | 10.1007/978-3-662-44362-0 |
Internformat
MARC
| LEADER | 00000nmm a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV042273666 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150115s2015 gw |||| o||u| ||||||eng d | ||
| 020 | |a 9783662443620 |c Online |9 978-3-662-44362-0 | ||
| 024 | 7 | |a 10.1007/978-3-662-44362-0 |2 doi | |
| 035 | |a (OCoLC)897553861 | ||
| 035 | |a (DE-599)BVBBV042273666 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-703 |a DE-91 | ||
| 082 | 0 | |a 621.3 | |
| 084 | |a UH 5100 |0 (DE-625)145654: |2 rvk | ||
| 084 | |a PHY 000 |2 stub | ||
| 084 | |a 621.3 |2 sdnb | ||
| 245 | 1 | 0 | |a X-Ray absorption spectroscopy of semiconductors |c Claudia S. Schnohr ; Mark C. Ridgway, ed. |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 2015 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Optical Sciences |v 190 | |
| 650 | 0 | 7 | |a Röntgenabsorptionsspektroskopie |0 (DE-588)4178303-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Röntgenabsorptionsspektroskopie |0 (DE-588)4178303-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Schnohr, Claudia S. |e Sonstige |4 oth | |
| 700 | 1 | |a Ridgway, Mark C. |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-3-662-44361-3 |
| 830 | 0 | |a Springer Series in Optical Sciences |v 190 |w (DE-604)BV040700999 |9 190 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-662-44362-0 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027711180 | ||
| 966 | e | |u https://doi.org/10.1007/978-3-662-44362-0 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-662-44362-0 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804152834308964352 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV042273666 |
| classification_rvk | UH 5100 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (OCoLC)897553861 (DE-599)BVBBV042273666 |
| dewey-full | 621.3 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3 |
| dewey-search | 621.3 |
| dewey-sort | 3621.3 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-662-44362-0 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01811nmm a2200481 cb4500</leader><controlfield tag="001">BV042273666</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150115s2015 gw |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783662443620</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-662-44362-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-662-44362-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)897553861</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042273666</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5100</subfield><subfield code="0">(DE-625)145654:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">621.3</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-Ray absorption spectroscopy of semiconductors</subfield><subfield code="c">Claudia S. Schnohr ; Mark C. Ridgway, ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">190</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenabsorptionsspektroskopie</subfield><subfield code="0">(DE-588)4178303-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Röntgenabsorptionsspektroskopie</subfield><subfield code="0">(DE-588)4178303-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schnohr, Claudia S.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ridgway, Mark C.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-3-662-44361-3</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">190</subfield><subfield code="w">(DE-604)BV040700999</subfield><subfield code="9">190</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-662-44362-0</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027711180</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-662-44362-0</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-662-44362-0</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV042273666 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:17:00Z |
| institution | BVB |
| isbn | 9783662443620 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027711180 |
| oclc_num | 897553861 |
| open_access_boolean | |
| owner | DE-703 DE-91 DE-BY-TUM |
| owner_facet | DE-703 DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource |
| psigel | ZDB-2-PHA |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Springer |
| record_format | marc |
| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spelling | X-Ray absorption spectroscopy of semiconductors Claudia S. Schnohr ; Mark C. Ridgway, ed. Berlin [u.a.] Springer 2015 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 190 Röntgenabsorptionsspektroskopie (DE-588)4178303-7 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Röntgenabsorptionsspektroskopie (DE-588)4178303-7 s DE-604 Schnohr, Claudia S. Sonstige oth Ridgway, Mark C. Sonstige oth Erscheint auch als Druckausgabe 978-3-662-44361-3 Springer Series in Optical Sciences 190 (DE-604)BV040700999 190 https://doi.org/10.1007/978-3-662-44362-0 Verlag Volltext |
| spellingShingle | X-Ray absorption spectroscopy of semiconductors Springer Series in Optical Sciences Röntgenabsorptionsspektroskopie (DE-588)4178303-7 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4178303-7 (DE-588)4022993-2 |
| title | X-Ray absorption spectroscopy of semiconductors |
| title_auth | X-Ray absorption spectroscopy of semiconductors |
| title_exact_search | X-Ray absorption spectroscopy of semiconductors |
| title_full | X-Ray absorption spectroscopy of semiconductors Claudia S. Schnohr ; Mark C. Ridgway, ed. |
| title_fullStr | X-Ray absorption spectroscopy of semiconductors Claudia S. Schnohr ; Mark C. Ridgway, ed. |
| title_full_unstemmed | X-Ray absorption spectroscopy of semiconductors Claudia S. Schnohr ; Mark C. Ridgway, ed. |
| title_short | X-Ray absorption spectroscopy of semiconductors |
| title_sort | x ray absorption spectroscopy of semiconductors |
| topic | Röntgenabsorptionsspektroskopie (DE-588)4178303-7 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Röntgenabsorptionsspektroskopie Halbleiter |
| url | https://doi.org/10.1007/978-3-662-44362-0 |
| volume_link | (DE-604)BV040700999 |
| work_keys_str_mv | AT schnohrclaudias xrayabsorptionspectroscopyofsemiconductors AT ridgwaymarkc xrayabsorptionspectroscopyofsemiconductors |