CMOS test and evaluation: a physical perspective
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Springer
2015
|
| Online-Zugang: | TUM01 URL des Erstveröffentlichers |
| ISBN: | 9781493913497 9781493913480 |
| DOI: | 10.1007/978-1-4939-1349-7 |
Internformat
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Datensatz im Suchindex
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| illustrated | Not Illustrated |
| indexdate | 2024-08-01T12:04:56Z |
| institution | BVB |
| isbn | 9781493913497 9781493913480 |
| language | English |
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| spellingShingle | Bhushan, Manjul CMOS test and evaluation a physical perspective |
| title | CMOS test and evaluation a physical perspective |
| title_auth | CMOS test and evaluation a physical perspective |
| title_exact_search | CMOS test and evaluation a physical perspective |
| title_full | CMOS test and evaluation a physical perspective Manjul Bhushan ; Mark B. Ketchen |
| title_fullStr | CMOS test and evaluation a physical perspective Manjul Bhushan ; Mark B. Ketchen |
| title_full_unstemmed | CMOS test and evaluation a physical perspective Manjul Bhushan ; Mark B. Ketchen |
| title_short | CMOS test and evaluation |
| title_sort | cmos test and evaluation a physical perspective |
| title_sub | a physical perspective |
| url | https://doi.org/10.1007/978-1-4939-1349-7 |
| work_keys_str_mv | AT bhushanmanjul cmostestandevaluationaphysicalperspective AT ketchenmarkb cmostestandevaluationaphysicalperspective |