Reliability and failure of electronic materials and devices:
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Bibliographic Details
Main Authors: Ohring, Milton (Author), Kasprzak, Lucian (Author)
Format: Book
Language:English
Published: Amsterdam [u.a.] Elsevier 2015
Edition:2. ed.
Subjects:
Physical Description:XXIV, 734 S. Ill., graph. Darst.
ISBN:9780120885749

There is no print copy available.

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