Surface Microscopy with Low Energy Electrons:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York, NY [u.a.]
Springer
2014
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Schlagworte: | |
Online-Zugang: | UBT01 Volltext Inhaltsverzeichnis Abstract |
Beschreibung: | 1 Online-Ressource |
ISBN: | 9781493909353 |
DOI: | 10.1007/978-1-4939-0935-3 |
Internformat
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Datensatz im Suchindex
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adam_text | SURFACE MICROSCOPY WITH LOW ENERGY ELECTRONS
/ BAUER, ERNST
: 2014
TABLE OF CONTENTS / INHALTSVERZEICHNIS
CHAPTER 1. INTRODUCTION
CHAPTER 2. BASIC INTERACTIONS
CHAPTER 3. INSTRUMENTATION
CHAPTER 4. THEORY OF IMAGE FORMATION
CHAPTER 5. APPLICATIONS IN SURFACE SCIENCE
CHAPTER 6. APPLICATIONS IN OTHER FIELDS
CHAPTER 7. MAGNETIC IMAGING
CHAPTER 8. OTHER SURFACE IMAGING METHODS WITH ELECTRONS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
SURFACE MICROSCOPY WITH LOW ENERGY ELECTRONS
/ BAUER, ERNST
: 2014
ABSTRACT / INHALTSTEXT
THIS BOOK, WRITTEN BY A PIONEER IN SURFACE PHYSICS AND THIN FILM
RESEARCH AND THE INVENTOR OF LOW ENERGY ELECTRON MICROSCOPY (LEEM),
SPIN-POLARIZED LOW ENERGY ELECTRON MICROSCOPY (SPLEEM) AND SPECTROSCOPIC
PHOTO EMISSION AND LOW ENERGY ELECTRON MICROSCOPY (SPELEEM),COVERS
THESE AND OTHER TECHNIQUES FOR THE IMAGING OF SURFACES WITH LOW ENERGY
(SLOW) ELECTRONS. THESE TECHNIQUES ALSO INCLUDE PHOTOEMISSION ELECTRON
MICROSCOPY (PEEM), X-RAY PHOTOEMISSION ELECTRON MICROSCOPY (XPEEM), AND
THEIR COMBINATION WITH MICRODIFFRACTION AND MICROSPECTROSCOPY, ALL OF
WHICH USE CATHODE LENSES AND SLOW ELECTRONS. OF PARTICULAR INTEREST ARE
THE FUNDAMENTALS AND APPLICATIONS OF LEEM, PEEM, AND XPEEM BECAUSE OF
THEIR WIDESPREAD USE. NUMEROUS ILLUSTRATIONS ILLUMINATE THE FUNDAMENTAL
ASPECTS OF THE ELECTRON OPTICS, THE EXPERIMENTAL SETUP, AND PARTICULARLY
THE APPLICATION RESULTS WITH THESE INSTRUMENTS. SURFACE MICROSCOPY WITH
LOW ENERGY ELECTRONS WILL GIVE THE READER A UNIFIED PICTURE OF THE
IMAGING, DIFFRACTION, AND SPECTROSCOPY METHODS THAT ARE POSSIBLE USING
LOW ENERGY ELECTRON MICROSCOPES. PROVIDES A UNIFIED DESCRIPTION OF
FULL-FIELD, LOW ENERGY ELECTRON MICROSCOPIES PRESENTS THE BASIC THEORY
AND EXPERIMENT OF LOW ENERGY EMISSION AND REFLECTION COMPARES THE
POSSIBILITIES AND LIMITATIONS OF THE VARIOUS IMAGING METHODS DESCRIBES
MULTI-METHOD STUDIES CONTAINS AN EXTENSIVE LIST OF REFERENCES FOR EASY
ACCESS TO THE ORIGINAL LITERATURE /UL
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
any_adam_object | 1 |
author | Bauer, Ernst 1928- |
author_GND | (DE-588)142948608 |
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callnumber-first | T - Technology |
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callnumber-subject | TA - General and Civil Engineering |
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collection | ZDB-2-CMS |
ctrlnum | (OCoLC)885824314 (DE-599)BSZ412877953 |
dewey-full | 530 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 530 - Physics |
dewey-raw | 530 |
dewey-search | 530 |
dewey-sort | 3530 |
dewey-tens | 530 - Physics |
discipline | Chemie / Pharmazie Physik |
doi_str_mv | 10.1007/978-1-4939-0935-3 |
format | Electronic eBook |
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language | English |
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spelling | Bauer, Ernst 1928- Verfasser (DE-588)142948608 aut Surface Microscopy with Low Energy Electrons Ernst Bauer New York, NY [u.a.] Springer 2014 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Spectroscopy Microscopy Surfaces (Physics) Materials Science Mikroskopie (DE-588)4039238-7 gnd rswk-swf Oberfläche (DE-588)4042907-6 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Spektroskopie (DE-588)4056138-0 s Mikroskopie (DE-588)4039238-7 s Oberfläche (DE-588)4042907-6 s 1\p DE-604 Erscheint auch als Druckausgabe 978-1-4939-0934-6 https://doi.org/10.1007/978-1-4939-0935-3 Verlag Volltext Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027493822&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027493822&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Abstract 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Bauer, Ernst 1928- Surface Microscopy with Low Energy Electrons Spectroscopy Microscopy Surfaces (Physics) Materials Science Mikroskopie (DE-588)4039238-7 gnd Oberfläche (DE-588)4042907-6 gnd Spektroskopie (DE-588)4056138-0 gnd |
subject_GND | (DE-588)4039238-7 (DE-588)4042907-6 (DE-588)4056138-0 |
title | Surface Microscopy with Low Energy Electrons |
title_auth | Surface Microscopy with Low Energy Electrons |
title_exact_search | Surface Microscopy with Low Energy Electrons |
title_full | Surface Microscopy with Low Energy Electrons Ernst Bauer |
title_fullStr | Surface Microscopy with Low Energy Electrons Ernst Bauer |
title_full_unstemmed | Surface Microscopy with Low Energy Electrons Ernst Bauer |
title_short | Surface Microscopy with Low Energy Electrons |
title_sort | surface microscopy with low energy electrons |
topic | Spectroscopy Microscopy Surfaces (Physics) Materials Science Mikroskopie (DE-588)4039238-7 gnd Oberfläche (DE-588)4042907-6 gnd Spektroskopie (DE-588)4056138-0 gnd |
topic_facet | Spectroscopy Microscopy Surfaces (Physics) Materials Science Mikroskopie Oberfläche Spektroskopie |
url | https://doi.org/10.1007/978-1-4939-0935-3 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027493822&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027493822&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT bauerernst surfacemicroscopywithlowenergyelectrons |