In-situ electron microscopy: applications in physics, chemistry and materials science
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Weinheim
Wiley-VCH
2012
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9783527652167 9783527319732 9783527652198 9783527652181 9783527652174 |
Internformat
MARC
| LEADER | 00000nmm a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV041935394 | ||
| 003 | DE-604 | ||
| 005 | 20190412 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 140626s2012 |||| o||u| ||||||eng d | ||
| 020 | |a 9783527652167 |c Online |9 978-3-527-65216-7 | ||
| 020 | |a 9783527319732 |c Print |9 978-3-527-31973-2 | ||
| 020 | |a 9783527652198 |c ePDF |9 978-3-527-65219-8 | ||
| 020 | |a 9783527652181 |c ePub |9 978-3-527-65218-1 | ||
| 020 | |a 9783527652174 |c mobi |9 978-3-527-65217-4 | ||
| 020 | |a 9783527652181 |c ePub |9 978-3-527-65218-1 | ||
| 024 | 7 | |a 10.1002/9783527652167 |2 doi | |
| 035 | |a (OCoLC)798302487 | ||
| 035 | |a (DE-599)BVBBV041935394 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-861 | ||
| 082 | 0 | |a 502.825 |2 23 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UT 8110 |0 (DE-625)146846: |2 rvk | ||
| 245 | 1 | 0 | |a In-situ electron microscopy |b applications in physics, chemistry and materials science |c edited by Gerhard Dehm, James M. Howe, Josef Zweck |
| 264 | 1 | |a Weinheim |b Wiley-VCH |c 2012 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Electron microscopy | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a In situ |0 (DE-588)4293230-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a In situ |0 (DE-588)4293230-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Dehm, Gerhard |e Sonstige |4 oth | |
| 700 | 1 | |a Howe, James M. |d 1955- |e Sonstige |0 (DE-588)122354818 |4 oth | |
| 700 | 1 | |a Zweck, Josef |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9783527652167 |x Verlag |3 Volltext |
| 912 | |a ZDB-35-WCC |a ZDB-35-WIC | ||
| 940 | 1 | |q UBT_ZDB-35-WCC_2012 | |
| 940 | 1 | |q FRO_PDA_WIC | |
| 940 | 1 | |q UBG_PDA_WIC | |
| 940 | 1 | |q FHR_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027378591 | ||
Datensatz im Suchindex
| _version_ | 1804152312510283776 |
|---|---|
| any_adam_object | |
| author_GND | (DE-588)122354818 |
| building | Verbundindex |
| bvnumber | BV041935394 |
| classification_rvk | UH 6300 UT 8110 |
| collection | ZDB-35-WCC ZDB-35-WIC |
| ctrlnum | (OCoLC)798302487 (DE-599)BVBBV041935394 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01919nmm a2200529 c 4500</leader><controlfield tag="001">BV041935394</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20190412 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">140626s2012 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527652167</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-527-65216-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527319732</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-527-31973-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527652198</subfield><subfield code="c">ePDF</subfield><subfield code="9">978-3-527-65219-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527652181</subfield><subfield code="c">ePub</subfield><subfield code="9">978-3-527-65218-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527652174</subfield><subfield code="c">mobi</subfield><subfield code="9">978-3-527-65217-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527652181</subfield><subfield code="c">ePub</subfield><subfield code="9">978-3-527-65218-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/9783527652167</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)798302487</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041935394</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-861</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.825</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UT 8110</subfield><subfield code="0">(DE-625)146846:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">In-situ electron microscopy</subfield><subfield code="b">applications in physics, chemistry and materials science</subfield><subfield code="c">edited by Gerhard Dehm, James M. Howe, Josef Zweck</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Weinheim</subfield><subfield code="b">Wiley-VCH</subfield><subfield code="c">2012</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dehm, Gerhard</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Howe, James M.</subfield><subfield code="d">1955-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)122354818</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zweck, Josef</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527652167</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WCC</subfield><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBT_ZDB-35-WCC_2012</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FRO_PDA_WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FHR_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027378591</subfield></datafield></record></collection> |
| id | DE-604.BV041935394 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:08:43Z |
| institution | BVB |
| isbn | 9783527652167 9783527319732 9783527652198 9783527652181 9783527652174 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027378591 |
| oclc_num | 798302487 |
| open_access_boolean | |
| owner | DE-703 DE-861 |
| owner_facet | DE-703 DE-861 |
| physical | 1 Online-Ressource |
| psigel | ZDB-35-WCC ZDB-35-WIC UBT_ZDB-35-WCC_2012 FRO_PDA_WIC UBG_PDA_WIC FHR_PDA_WIC |
| publishDate | 2012 |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| publisher | Wiley-VCH |
| record_format | marc |
| spelling | In-situ electron microscopy applications in physics, chemistry and materials science edited by Gerhard Dehm, James M. Howe, Josef Zweck Weinheim Wiley-VCH 2012 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf In situ (DE-588)4293230-0 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s In situ (DE-588)4293230-0 s DE-604 Dehm, Gerhard Sonstige oth Howe, James M. 1955- Sonstige (DE-588)122354818 oth Zweck, Josef Sonstige oth https://onlinelibrary.wiley.com/doi/book/10.1002/9783527652167 Verlag Volltext |
| spellingShingle | In-situ electron microscopy applications in physics, chemistry and materials science Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd In situ (DE-588)4293230-0 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4293230-0 |
| title | In-situ electron microscopy applications in physics, chemistry and materials science |
| title_auth | In-situ electron microscopy applications in physics, chemistry and materials science |
| title_exact_search | In-situ electron microscopy applications in physics, chemistry and materials science |
| title_full | In-situ electron microscopy applications in physics, chemistry and materials science edited by Gerhard Dehm, James M. Howe, Josef Zweck |
| title_fullStr | In-situ electron microscopy applications in physics, chemistry and materials science edited by Gerhard Dehm, James M. Howe, Josef Zweck |
| title_full_unstemmed | In-situ electron microscopy applications in physics, chemistry and materials science edited by Gerhard Dehm, James M. Howe, Josef Zweck |
| title_short | In-situ electron microscopy |
| title_sort | in situ electron microscopy applications in physics chemistry and materials science |
| title_sub | applications in physics, chemistry and materials science |
| topic | Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd In situ (DE-588)4293230-0 gnd |
| topic_facet | Electron microscopy Elektronenmikroskopie In situ |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9783527652167 |
| work_keys_str_mv | AT dehmgerhard insituelectronmicroscopyapplicationsinphysicschemistryandmaterialsscience AT howejamesm insituelectronmicroscopyapplicationsinphysicschemistryandmaterialsscience AT zweckjosef insituelectronmicroscopyapplicationsinphysicschemistryandmaterialsscience |