Accelerating test, validation and debug of high speed serial interfaces:
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Bibliographic Details
Main Author: Fan, Yongquan (Author)
Format: Electronic eBook
Language:English
Published: Dordrecht Springer 2011
Subjects:
Online Access:Volltext
Item Description:Includes bibliographical references (p. [183]-192) and index
Physical Description:1 Online-Ressource (xii 194 p.)
ISBN:9781282996403

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