Analysis and design of resilient VLSI circuits: mitigating soft errors and process variations
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York
Springer
c2010
|
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | Includes bibliographical references (p. 283-298) and index |
Beschreibung: | 1 Online-Ressource (xxii, 212 p.) |
ISBN: | 1441909311 9781441909312 9781282836815 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author | Garg, Rajesh |
author_facet | Garg, Rajesh |
author_role | aut |
author_sort | Garg, Rajesh |
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building | Verbundindex |
bvnumber | BV041911740 |
collection | ZDB-26-MYL |
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dewey-full | 621.395 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.395 |
dewey-search | 621.395 |
dewey-sort | 3621.395 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
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id | DE-604.BV041911740 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:08:07Z |
institution | BVB |
isbn | 1441909311 9781441909312 9781282836815 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027355409 |
oclc_num | 778311647 |
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physical | 1 Online-Ressource (xxii, 212 p.) |
psigel | ZDB-26-MYL |
publishDate | 2010 |
publishDateSearch | 2010 |
publishDateSort | 2010 |
publisher | Springer |
record_format | marc |
spelling | Garg, Rajesh Verfasser aut Analysis and design of resilient VLSI circuits mitigating soft errors and process variations Rajesh Garg, Sunil P. Khatri New York Springer c2010 1 Online-Ressource (xxii, 212 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (p. 283-298) and index Integrated circuits / Very large scale integration Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s VLSI (DE-588)4117388-0 s 1\p DE-604 Khatri, Sunil P. Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 1-4419-0930-3 Erscheint auch als Druck-Ausgabe, Hardcover 978-1-4419-0930-5 http://lib.myilibrary.com?id=283681 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Garg, Rajesh Analysis and design of resilient VLSI circuits mitigating soft errors and process variations Integrated circuits / Very large scale integration Integrierte Schaltung (DE-588)4027242-4 gnd VLSI (DE-588)4117388-0 gnd |
subject_GND | (DE-588)4027242-4 (DE-588)4117388-0 |
title | Analysis and design of resilient VLSI circuits mitigating soft errors and process variations |
title_auth | Analysis and design of resilient VLSI circuits mitigating soft errors and process variations |
title_exact_search | Analysis and design of resilient VLSI circuits mitigating soft errors and process variations |
title_full | Analysis and design of resilient VLSI circuits mitigating soft errors and process variations Rajesh Garg, Sunil P. Khatri |
title_fullStr | Analysis and design of resilient VLSI circuits mitigating soft errors and process variations Rajesh Garg, Sunil P. Khatri |
title_full_unstemmed | Analysis and design of resilient VLSI circuits mitigating soft errors and process variations Rajesh Garg, Sunil P. Khatri |
title_short | Analysis and design of resilient VLSI circuits |
title_sort | analysis and design of resilient vlsi circuits mitigating soft errors and process variations |
title_sub | mitigating soft errors and process variations |
topic | Integrated circuits / Very large scale integration Integrierte Schaltung (DE-588)4027242-4 gnd VLSI (DE-588)4117388-0 gnd |
topic_facet | Integrated circuits / Very large scale integration Integrierte Schaltung VLSI |
url | http://lib.myilibrary.com?id=283681 |
work_keys_str_mv | AT gargrajesh analysisanddesignofresilientvlsicircuitsmitigatingsofterrorsandprocessvariations AT khatrisunilp analysisanddesignofresilientvlsicircuitsmitigatingsofterrorsandprocessvariations |