Microelectronic test structures for CMOS technology:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York
Springer
c2011
|
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | 1 Online-Ressource (xxxiv, 373 p.) |
| ISBN: | 9781441993779 1441993770 9781283351034 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV041907692 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 140612s2011 |||| o||u| ||||||eng d | ||
| 020 | |a 9781441993779 |c electronic bk. |9 978-1-4419-9377-9 | ||
| 020 | |a 1441993770 |c electronic bk. |9 1-4419-9377-0 | ||
| 020 | |a 9781283351034 |c MyiLibrary |9 978-1-283-35103-4 | ||
| 035 | |a (OCoLC)823130683 | ||
| 035 | |a (DE-599)BVBBV041907692 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.3815/2 |2 23 | |
| 100 | 1 | |a Bhushan, Manjul |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Microelectronic test structures for CMOS technology |c Manjul Bhushan, Mark B. Ketchen |
| 264 | 1 | |a New York |b Springer |c c2011 | |
| 300 | |a 1 Online-Ressource (xxxiv, 373 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Metal oxide semiconductors, Complementary / Testing | |
| 700 | 1 | |a Ketchen, Mark B. |e Sonstige |4 oth | |
| 710 | 2 | |a SpringerLink (Online service) |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://lib.myilibrary.com?id=335103 |x Aggregator |3 Volltext |
| 912 | |a ZDB-26-MYL | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027351360 | ||
Record in the Search Index
| _version_ | 1804152267528470528 |
|---|---|
| any_adam_object | |
| author | Bhushan, Manjul |
| author_facet | Bhushan, Manjul |
| author_role | aut |
| author_sort | Bhushan, Manjul |
| author_variant | m b mb |
| building | Verbundindex |
| bvnumber | BV041907692 |
| collection | ZDB-26-MYL |
| ctrlnum | (OCoLC)823130683 (DE-599)BVBBV041907692 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01245nmm a2200349zc 4500</leader><controlfield tag="001">BV041907692</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">140612s2011 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781441993779</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-4419-9377-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1441993770</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">1-4419-9377-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781283351034</subfield><subfield code="c">MyiLibrary</subfield><subfield code="9">978-1-283-35103-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)823130683</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041907692</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bhushan, Manjul</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microelectronic test structures for CMOS technology</subfield><subfield code="c">Manjul Bhushan, Mark B. Ketchen</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Springer</subfield><subfield code="c">c2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xxxiv, 373 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metal oxide semiconductors, Complementary / Testing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ketchen, Mark B.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">SpringerLink (Online service)</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://lib.myilibrary.com?id=335103</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-26-MYL</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027351360</subfield></datafield></record></collection> |
| id | DE-604.BV041907692 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:08:00Z |
| institution | BVB |
| isbn | 9781441993779 1441993770 9781283351034 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027351360 |
| oclc_num | 823130683 |
| open_access_boolean | |
| physical | 1 Online-Ressource (xxxiv, 373 p.) |
| psigel | ZDB-26-MYL |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Springer |
| record_format | marc |
| spelling | Bhushan, Manjul Verfasser aut Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen New York Springer c2011 1 Online-Ressource (xxxiv, 373 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Metal oxide semiconductors, Complementary / Testing Ketchen, Mark B. Sonstige oth SpringerLink (Online service) Sonstige oth http://lib.myilibrary.com?id=335103 Aggregator Volltext |
| spellingShingle | Bhushan, Manjul Microelectronic test structures for CMOS technology Metal oxide semiconductors, Complementary / Testing |
| title | Microelectronic test structures for CMOS technology |
| title_auth | Microelectronic test structures for CMOS technology |
| title_exact_search | Microelectronic test structures for CMOS technology |
| title_full | Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen |
| title_fullStr | Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen |
| title_full_unstemmed | Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen |
| title_short | Microelectronic test structures for CMOS technology |
| title_sort | microelectronic test structures for cmos technology |
| topic | Metal oxide semiconductors, Complementary / Testing |
| topic_facet | Metal oxide semiconductors, Complementary / Testing |
| url | http://lib.myilibrary.com?id=335103 |
| work_keys_str_mv | AT bhushanmanjul microelectronicteststructuresforcmostechnology AT ketchenmarkb microelectronicteststructuresforcmostechnology AT springerlinkonlineservice microelectronicteststructuresforcmostechnology |