Microelectronic test structures for CMOS technology:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Springer
c2011
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xxxiv, 373 p.) |
| ISBN: | 9781441993779 1441993770 9781283351034 |
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Datensatz im Suchindex
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:08:00Z |
| institution | BVB |
| isbn | 9781441993779 1441993770 9781283351034 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027351360 |
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| physical | 1 Online-Ressource (xxxiv, 373 p.) |
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| publishDate | 2011 |
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| publisher | Springer |
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| spelling | Bhushan, Manjul Verfasser aut Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen New York Springer c2011 1 Online-Ressource (xxxiv, 373 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Metal oxide semiconductors, Complementary / Testing Ketchen, Mark B. Sonstige oth SpringerLink (Online service) Sonstige oth http://lib.myilibrary.com?id=335103 Aggregator Volltext |
| spellingShingle | Bhushan, Manjul Microelectronic test structures for CMOS technology Metal oxide semiconductors, Complementary / Testing |
| title | Microelectronic test structures for CMOS technology |
| title_auth | Microelectronic test structures for CMOS technology |
| title_exact_search | Microelectronic test structures for CMOS technology |
| title_full | Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen |
| title_fullStr | Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen |
| title_full_unstemmed | Microelectronic test structures for CMOS technology Manjul Bhushan, Mark B. Ketchen |
| title_short | Microelectronic test structures for CMOS technology |
| title_sort | microelectronic test structures for cmos technology |
| topic | Metal oxide semiconductors, Complementary / Testing |
| topic_facet | Metal oxide semiconductors, Complementary / Testing |
| url | http://lib.myilibrary.com?id=335103 |
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