Lock-in thermography: basics and use for evaluating electronic devices and materials
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Heidelberg [Germany]
Springer
c2010
|
| Ausgabe: | 2nd ed |
| Schriftenreihe: | Springer series in advanced microelectronics
10 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references (p. 235-244) and index |
| Beschreibung: | 1 Online-Ressource (x, 255 p.) |
| ISBN: | 9783642024177 3642024173 9781282982062 |
Internformat
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Datensatz im Suchindex
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| author | Breitenstein, O., (Otwin) |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| edition | 2nd ed |
| format | Electronic eBook |
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| spelling | Breitenstein, O., (Otwin) Verfasser aut Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein, W. Warta, M. Langenkamp 2nd ed Heidelberg [Germany] Springer c2010 1 Online-Ressource (x, 255 p.) txt rdacontent c rdamedia cr rdacarrier Springer series in advanced microelectronics 10 Includes bibliographical references (p. 235-244) and index Electronic apparatus and appliances / Thermal properties Electronic apparatus and appliances / Testing Semiconductors / Thermal properties Thermography Prüftechnik (DE-588)4047610-8 gnd rswk-swf Infrarotthermographie (DE-588)4242353-3 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Infrarotthermographie (DE-588)4242353-3 s 2\p DE-604 Warta, Wilhelm Sonstige oth Langenkamp, M. Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-3-642-02416-0 Erscheint auch als Druck-Ausgabe, Hardcover 3-642-02416-5 http://lib.myilibrary.com?id=298206 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Breitenstein, O., (Otwin) Lock-in thermography basics and use for evaluating electronic devices and materials Electronic apparatus and appliances / Thermal properties Electronic apparatus and appliances / Testing Semiconductors / Thermal properties Thermography Prüftechnik (DE-588)4047610-8 gnd Infrarotthermographie (DE-588)4242353-3 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4242353-3 (DE-588)4014360-0 |
| title | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_auth | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_exact_search | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_full | Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein, W. Warta, M. Langenkamp |
| title_fullStr | Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein, W. Warta, M. Langenkamp |
| title_full_unstemmed | Lock-in thermography basics and use for evaluating electronic devices and materials O. Breitenstein, W. Warta, M. Langenkamp |
| title_short | Lock-in thermography |
| title_sort | lock in thermography basics and use for evaluating electronic devices and materials |
| title_sub | basics and use for evaluating electronic devices and materials |
| topic | Electronic apparatus and appliances / Thermal properties Electronic apparatus and appliances / Testing Semiconductors / Thermal properties Thermography Prüftechnik (DE-588)4047610-8 gnd Infrarotthermographie (DE-588)4242353-3 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Electronic apparatus and appliances / Thermal properties Electronic apparatus and appliances / Testing Semiconductors / Thermal properties Thermography Prüftechnik Infrarotthermographie Elektronisches Bauelement |
| url | http://lib.myilibrary.com?id=298206 |
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