Design, analysis and test of logic circuits under uncertainty:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Dordrecht
Springer
c2013
|
| Schriftenreihe: | Lecture notes in electrical engineering
v.115 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9789048196449 9048196442 9789048196432 9781283640770 |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:07:58Z |
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| isbn | 9789048196449 9048196442 9789048196432 9781283640770 |
| language | English |
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| series2 | Lecture notes in electrical engineering |
| spelling | Krishnaswamy, Smita Verfasser aut Design, analysis and test of logic circuits under uncertainty Smita Krishnaswamy, Igor L. Markov, John P. Hayes Dordrecht Springer c2013 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Lecture notes in electrical engineering v.115 Includes bibliographical references and index Logic circuits / Design Logic circuits / Testing Uncertainty (Information theory) Markov, Igor L. Sonstige oth Hayes, John P. Sonstige oth http://lib.myilibrary.com?id=395327 Aggregator Volltext |
| spellingShingle | Krishnaswamy, Smita Design, analysis and test of logic circuits under uncertainty Logic circuits / Design Logic circuits / Testing Uncertainty (Information theory) |
| title | Design, analysis and test of logic circuits under uncertainty |
| title_auth | Design, analysis and test of logic circuits under uncertainty |
| title_exact_search | Design, analysis and test of logic circuits under uncertainty |
| title_full | Design, analysis and test of logic circuits under uncertainty Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
| title_fullStr | Design, analysis and test of logic circuits under uncertainty Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
| title_full_unstemmed | Design, analysis and test of logic circuits under uncertainty Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
| title_short | Design, analysis and test of logic circuits under uncertainty |
| title_sort | design analysis and test of logic circuits under uncertainty |
| topic | Logic circuits / Design Logic circuits / Testing Uncertainty (Information theory) |
| topic_facet | Logic circuits / Design Logic circuits / Testing Uncertainty (Information theory) |
| url | http://lib.myilibrary.com?id=395327 |
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