Yablon, D. G. (2014). Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley.
Chicago Style (17th ed.) CitationYablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014.
MLA (9th ed.) CitationYablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, 2014.
Warning: These citations may not always be 100% accurate.