Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Dordrecht
Springer Netherlands
2010
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Schriftenreihe: | Frontiers in Electronic Testing
43 |
Schlagworte: | |
Online-Zugang: | BTU01 FHI01 FHN01 FHR01 Volltext |
Beschreibung: | Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009 |
Beschreibung: | 1 Online-Ressource (XIV, 257 p) |
ISBN: | 9789048132829 |
DOI: | 10.1007/978-90-481-3282-9 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV041889753 | ||
003 | DE-604 | ||
005 | 20180321 | ||
007 | cr|uuu---uuuuu | ||
008 | 140603s2010 |||| o||u| ||||||eng d | ||
020 | |a 9789048132829 |c Online |9 978-90-481-3282-9 | ||
024 | 7 | |a 10.1007/978-90-481-3282-9 |2 doi | |
035 | |a (OCoLC)881633983 | ||
035 | |a (DE-599)BVBBV041889753 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-634 |a DE-898 |a DE-573 |a DE-92 |a DE-83 | ||
082 | 0 | |a 621.3815 |2 23 | |
100 | 1 | |a Wunderlich, Hans-Joachim |e Verfasser |0 (DE-588)1022202154 |4 aut | |
245 | 1 | 0 | |a Models in Hardware Testing |b Lecture Notes of the Forum in Honor of Christian Landrault |c edited by Hans-Joachim Wunderlich |
264 | 1 | |a Dordrecht |b Springer Netherlands |c 2010 | |
300 | |a 1 Online-Ressource (XIV, 257 p) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Frontiers in Electronic Testing |v 43 | |
500 | |a Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009 | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Operating systems (Computers) | |
650 | 4 | |a Systems engineering | |
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Performance and Reliability | |
650 | 4 | |a Ingenieurwissenschaften | |
655 | 7 | |8 1\p |0 (DE-588)4016928-5 |a Festschrift |2 gnd-content | |
776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-90-481-3281-2 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-90-481-3282-9 |x Verlag |3 Volltext |
912 | |a ZDB-2-ENG | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-027333707 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
966 | e | |u https://doi.org/10.1007/978-90-481-3282-9 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-90-481-3282-9 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-90-481-3282-9 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-90-481-3282-9 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804152238992523264 |
---|---|
any_adam_object | |
author | Wunderlich, Hans-Joachim |
author_GND | (DE-588)1022202154 |
author_facet | Wunderlich, Hans-Joachim |
author_role | aut |
author_sort | Wunderlich, Hans-Joachim |
author_variant | h j w hjw |
building | Verbundindex |
bvnumber | BV041889753 |
collection | ZDB-2-ENG |
ctrlnum | (OCoLC)881633983 (DE-599)BVBBV041889753 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-90-481-3282-9 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03154nmm a2200481zcb4500</leader><controlfield tag="001">BV041889753</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180321 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">140603s2010 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789048132829</subfield><subfield code="c">Online</subfield><subfield code="9">978-90-481-3282-9</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-90-481-3282-9</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)881633983</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041889753</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wunderlich, Hans-Joachim</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1022202154</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Models in Hardware Testing</subfield><subfield code="b">Lecture Notes of the Forum in Honor of Christian Landrault</subfield><subfield code="c">edited by Hans-Joachim Wunderlich</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Dordrecht</subfield><subfield code="b">Springer Netherlands</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIV, 257 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">43</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Operating systems (Computers)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Performance and Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4016928-5</subfield><subfield code="a">Festschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-90-481-3281-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-90-481-3282-9</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027333707</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-90-481-3282-9</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-90-481-3282-9</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-90-481-3282-9</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-90-481-3282-9</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
genre | 1\p (DE-588)4016928-5 Festschrift gnd-content |
genre_facet | Festschrift |
id | DE-604.BV041889753 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:07:33Z |
institution | BVB |
isbn | 9789048132829 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027333707 |
oclc_num | 881633983 |
open_access_boolean | |
owner | DE-634 DE-898 DE-BY-UBR DE-573 DE-92 DE-83 |
owner_facet | DE-634 DE-898 DE-BY-UBR DE-573 DE-92 DE-83 |
physical | 1 Online-Ressource (XIV, 257 p) |
psigel | ZDB-2-ENG |
publishDate | 2010 |
publishDateSearch | 2010 |
publishDateSort | 2010 |
publisher | Springer Netherlands |
record_format | marc |
series2 | Frontiers in Electronic Testing |
spelling | Wunderlich, Hans-Joachim Verfasser (DE-588)1022202154 aut Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault edited by Hans-Joachim Wunderlich Dordrecht Springer Netherlands 2010 1 Online-Ressource (XIV, 257 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 43 Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009 Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Ingenieurwissenschaften 1\p (DE-588)4016928-5 Festschrift gnd-content Erscheint auch als Druckausgabe 978-90-481-3281-2 https://doi.org/10.1007/978-90-481-3282-9 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Wunderlich, Hans-Joachim Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Ingenieurwissenschaften |
subject_GND | (DE-588)4016928-5 |
title | Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault |
title_auth | Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault |
title_exact_search | Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault |
title_full | Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault edited by Hans-Joachim Wunderlich |
title_fullStr | Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault edited by Hans-Joachim Wunderlich |
title_full_unstemmed | Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault edited by Hans-Joachim Wunderlich |
title_short | Models in Hardware Testing |
title_sort | models in hardware testing lecture notes of the forum in honor of christian landrault |
title_sub | Lecture Notes of the Forum in Honor of Christian Landrault |
topic | Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Ingenieurwissenschaften |
topic_facet | Engineering Operating systems (Computers) Systems engineering Circuits and Systems Performance and Reliability Ingenieurwissenschaften Festschrift |
url | https://doi.org/10.1007/978-90-481-3282-9 |
work_keys_str_mv | AT wunderlichhansjoachim modelsinhardwaretestinglecturenotesoftheforuminhonorofchristianlandrault |