APA (7th ed.) Citation

Bosio, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1.). Springer US. https://doi.org/10.1007/978-1-4419-0938-1

Chicago Style (17th ed.) Citation

Bosio, Alberto. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer US, 2010. https://doi.org/10.1007/978-1-4419-0938-1.

MLA (9th ed.) Citation

Bosio, Alberto. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Springer US, 2010. https://doi.org/10.1007/978-1-4419-0938-1.