Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2010
|
| Ausgabe: | 1 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FHI01 FHN01 FHR01 Volltext |
| Beschreibung: | Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9781441909381 |
| DOI: | 10.1007/978-1-4419-0938-1 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV041889572 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 140603s2010 |||| o||u| ||||||eng d | ||
| 020 | |a 9781441909381 |c Online |9 978-1-4419-0938-1 | ||
| 024 | 7 | |a 10.1007/978-1-4419-0938-1 |2 doi | |
| 035 | |a (OCoLC)881648341 | ||
| 035 | |a (DE-599)BVBBV041889572 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-634 |a DE-898 |a DE-573 |a DE-92 |a DE-83 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 100 | 1 | |a Bosio, Alberto |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced Test Methods for SRAMs |b Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies |c by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| 250 | |a 1 | ||
| 264 | 1 | |a Boston, MA |b Springer US |c 2010 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling | ||
| 505 | 0 | |a Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Computer aided design | |
| 650 | 4 | |a Systems engineering | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Computer-Aided Engineering (CAD, CAE) and Design | |
| 650 | 4 | |a Ingenieurwissenschaften | |
| 700 | 1 | |a Dilillo, Luigi |e Sonstige |4 oth | |
| 700 | 1 | |a Girard, Patrick |e Sonstige |4 oth | |
| 700 | 1 | |a Pravossoudovitch, Serge |e Sonstige |4 oth | |
| 700 | 1 | |a Virazel, Arnaud |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-1-4419-0937-4 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4419-0938-1 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027333525 | ||
| 966 | e | |u https://doi.org/10.1007/978-1-4419-0938-1 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-1-4419-0938-1 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-1-4419-0938-1 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-1-4419-0938-1 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804152238532198400 |
|---|---|
| any_adam_object | |
| author | Bosio, Alberto |
| author_facet | Bosio, Alberto |
| author_role | aut |
| author_sort | Bosio, Alberto |
| author_variant | a b ab |
| building | Verbundindex |
| bvnumber | BV041889572 |
| collection | ZDB-2-ENG |
| contents | Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis |
| ctrlnum | (OCoLC)881648341 (DE-599)BVBBV041889572 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-4419-0938-1 |
| edition | 1 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03794nmm a2200517zc 4500</leader><controlfield tag="001">BV041889572</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">140603s2010 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781441909381</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4419-0938-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4419-0938-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)881648341</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041889572</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bosio, Alberto</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced Test Methods for SRAMs</subfield><subfield code="b">Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies</subfield><subfield code="c">by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling</subfield></datafield><datafield tag="505" ind1="0" ind2=" "><subfield code="a">Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer aided design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-Aided Engineering (CAD, CAE) and Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dilillo, Luigi</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Girard, Patrick</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pravossoudovitch, Serge</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Virazel, Arnaud</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-1-4419-0937-4</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4419-0938-1</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027333525</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-0938-1</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-0938-1</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-0938-1</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-0938-1</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV041889572 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:07:32Z |
| institution | BVB |
| isbn | 9781441909381 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027333525 |
| oclc_num | 881648341 |
| open_access_boolean | |
| owner | DE-634 DE-898 DE-BY-UBR DE-573 DE-92 DE-83 |
| owner_facet | DE-634 DE-898 DE-BY-UBR DE-573 DE-92 DE-83 |
| physical | 1 Online-Ressource |
| psigel | ZDB-2-ENG |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Springer US |
| record_format | marc |
| spelling | Bosio, Alberto Verfasser aut Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel 1 Boston, MA Springer US 2010 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design Ingenieurwissenschaften Dilillo, Luigi Sonstige oth Girard, Patrick Sonstige oth Pravossoudovitch, Serge Sonstige oth Virazel, Arnaud Sonstige oth Erscheint auch als Druckausgabe 978-1-4419-0937-4 https://doi.org/10.1007/978-1-4419-0938-1 Verlag Volltext |
| spellingShingle | Bosio, Alberto Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design Ingenieurwissenschaften |
| title | Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies |
| title_auth | Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies |
| title_exact_search | Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies |
| title_full | Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| title_fullStr | Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| title_full_unstemmed | Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| title_short | Advanced Test Methods for SRAMs |
| title_sort | advanced test methods for srams effective solutions for dynamic fault detection in nanoscaled technologies |
| title_sub | Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies |
| topic | Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design Ingenieurwissenschaften |
| topic_facet | Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-1-4419-0938-1 |
| work_keys_str_mv | AT bosioalberto advancedtestmethodsforsramseffectivesolutionsfordynamicfaultdetectioninnanoscaledtechnologies AT dililloluigi advancedtestmethodsforsramseffectivesolutionsfordynamicfaultdetectioninnanoscaledtechnologies AT girardpatrick advancedtestmethodsforsramseffectivesolutionsfordynamicfaultdetectioninnanoscaledtechnologies AT pravossoudovitchserge advancedtestmethodsforsramseffectivesolutionsfordynamicfaultdetectioninnanoscaledtechnologies AT virazelarnaud advancedtestmethodsforsramseffectivesolutionsfordynamicfaultdetectioninnanoscaledtechnologies |