Cluster secondary ion mass spectrometry: principles and applications
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hoboken, New Jersey
Wiley
2013
|
| Series: | Wiley-Interscience series on mass spectrometry
|
| Subjects: | |
| Online Access: | FRO01 UBT01 Volltext |
| Item Description: | This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods |
| Physical Description: | 1 Online-Ressource |
| ISBN: | 9781118589243 9781118589250 9781118589335 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV041829197 | ||
| 003 | DE-604 | ||
| 005 | 20140610 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 140506s2013 |||| o||u| ||||||eng d | ||
| 020 | |a 9781118589243 |c ePub |9 978-1-118-58924-3 | ||
| 020 | |a 9781118589250 |c ePDF |9 978-1-118-58925-0 | ||
| 020 | |a 9781118589335 |c Online |9 978-1-118-58933-5 | ||
| 024 | 7 | |a 10.1002/9781118589335 |2 doi | |
| 035 | |a (OCoLC)874336796 | ||
| 035 | |a (DE-599)BVBBV041829197 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-861 | ||
| 082 | 0 | |a 543.65 | |
| 084 | |a UM 3120 |0 (DE-625)145868: |2 rvk | ||
| 084 | |a VE 8600 |0 (DE-625)147149:253 |2 rvk | ||
| 084 | |a VG 9800 |0 (DE-625)147244:253 |2 rvk | ||
| 100 | 1 | |a Mahoney, Christine M. |d 1975- |e Verfasser |0 (DE-588)1038795605 |4 aut | |
| 245 | 1 | 0 | |a Cluster secondary ion mass spectrometry |b principles and applications |c edited by Christine M. Mahoney |
| 264 | 1 | |a Hoboken, New Jersey |b Wiley |c 2013 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Wiley-Interscience series on mass spectrometry | |
| 500 | |a This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods | ||
| 650 | 4 | |a Secondary electron emission | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 7 | |a SCIENCE / Chemistry / Analytic |2 bisacsh | |
| 650 | 4 | |a Chemie | |
| 650 | 4 | |a Secondary ion mass spectrometry | |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Clusterion |0 (DE-588)4148106-9 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
| 689 | 0 | 1 | |a Clusterion |0 (DE-588)4148106-9 |D s |
| 689 | 0 | |C b |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-0-470-88605-2 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 |x Verlag |3 Volltext |
| 912 | |a ZDB-35-WIC | ||
| 940 | 1 | |q FHR_PDA_WIC | |
| 940 | 1 | |q UBG_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027274116 | ||
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 |l FRO01 |p ZDB-35-WIC |q FRO_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 |l UBT01 |p ZDB-35-WIC |q UBT_Wiley_EK_2014 |x Verlag |3 Volltext | |
Record in the Search Index
| _version_ | 1804152164451352576 |
|---|---|
| any_adam_object | |
| author | Mahoney, Christine M. 1975- |
| author_GND | (DE-588)1038795605 |
| author_facet | Mahoney, Christine M. 1975- |
| author_role | aut |
| author_sort | Mahoney, Christine M. 1975- |
| author_variant | c m m cm cmm |
| building | Verbundindex |
| bvnumber | BV041829197 |
| classification_rvk | UM 3120 VE 8600 VG 9800 |
| collection | ZDB-35-WIC |
| ctrlnum | (OCoLC)874336796 (DE-599)BVBBV041829197 |
| dewey-full | 543.65 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543.65 |
| dewey-search | 543.65 |
| dewey-sort | 3543.65 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02822nmm a2200565zc 4500</leader><controlfield tag="001">BV041829197</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20140610 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">140506s2013 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118589243</subfield><subfield code="c">ePub</subfield><subfield code="9">978-1-118-58924-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118589250</subfield><subfield code="c">ePDF</subfield><subfield code="9">978-1-118-58925-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118589335</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-118-58933-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/9781118589335</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)874336796</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041829197</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-861</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">543.65</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UM 3120</subfield><subfield code="0">(DE-625)145868:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VE 8600</subfield><subfield code="0">(DE-625)147149:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9800</subfield><subfield code="0">(DE-625)147244:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Mahoney, Christine M.</subfield><subfield code="d">1975-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1038795605</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Cluster secondary ion mass spectrometry</subfield><subfield code="b">principles and applications</subfield><subfield code="c">edited by Christine M. Mahoney</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, New Jersey</subfield><subfield code="b">Wiley</subfield><subfield code="c">2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Wiley-Interscience series on mass spectrometry</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Secondary electron emission</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Chemistry / Analytic</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemie</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Secondary ion mass spectrometry</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Clusterion</subfield><subfield code="0">(DE-588)4148106-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Clusterion</subfield><subfield code="0">(DE-588)4148106-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="C">b</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-0-470-88605-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FHR_PDA_WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027274116</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">FRO_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBT_Wiley_EK_2014</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV041829197 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:06:22Z |
| institution | BVB |
| isbn | 9781118589243 9781118589250 9781118589335 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027274116 |
| oclc_num | 874336796 |
| open_access_boolean | |
| owner | DE-703 DE-861 |
| owner_facet | DE-703 DE-861 |
| physical | 1 Online-Ressource |
| psigel | ZDB-35-WIC FHR_PDA_WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBT_Wiley_EK_2014 |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley-Interscience series on mass spectrometry |
| spelling | Mahoney, Christine M. 1975- Verfasser (DE-588)1038795605 aut Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney Hoboken, New Jersey Wiley 2013 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Wiley-Interscience series on mass spectrometry This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic bisacsh Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Clusterion (DE-588)4148106-9 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Clusterion (DE-588)4148106-9 s b DE-604 Erscheint auch als Druckausgabe 978-0-470-88605-2 https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 Verlag Volltext |
| spellingShingle | Mahoney, Christine M. 1975- Cluster secondary ion mass spectrometry principles and applications Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic bisacsh Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Clusterion (DE-588)4148106-9 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)4148106-9 |
| title | Cluster secondary ion mass spectrometry principles and applications |
| title_auth | Cluster secondary ion mass spectrometry principles and applications |
| title_exact_search | Cluster secondary ion mass spectrometry principles and applications |
| title_full | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
| title_fullStr | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
| title_full_unstemmed | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
| title_short | Cluster secondary ion mass spectrometry |
| title_sort | cluster secondary ion mass spectrometry principles and applications |
| title_sub | principles and applications |
| topic | Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic bisacsh Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Clusterion (DE-588)4148106-9 gnd |
| topic_facet | Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie Clusterion |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 |
| work_keys_str_mv | AT mahoneychristinem clustersecondaryionmassspectrometryprinciplesandapplications |