Cluster secondary ion mass spectrometry: principles and applications
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Hoboken, New Jersey
Wiley
2013
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Schriftenreihe: | Wiley-Interscience series on mass spectrometry
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Schlagworte: | |
Online-Zugang: | FRO01 UBT01 Volltext |
Beschreibung: | This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods |
Beschreibung: | 1 Online-Ressource |
ISBN: | 9781118589243 9781118589250 9781118589335 |
Internformat
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100 | 1 | |a Mahoney, Christine M. |d 1975- |e Verfasser |0 (DE-588)1038795605 |4 aut | |
245 | 1 | 0 | |a Cluster secondary ion mass spectrometry |b principles and applications |c edited by Christine M. Mahoney |
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300 | |a 1 Online-Ressource | ||
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500 | |a This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods | ||
650 | 4 | |a Secondary electron emission | |
650 | 4 | |a Surfaces (Physics) | |
650 | 7 | |a SCIENCE / Chemistry / Analytic |2 bisacsh | |
650 | 4 | |a Chemie | |
650 | 4 | |a Secondary ion mass spectrometry | |
650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Clusterion |0 (DE-588)4148106-9 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
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Datensatz im Suchindex
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any_adam_object | |
author | Mahoney, Christine M. 1975- |
author_GND | (DE-588)1038795605 |
author_facet | Mahoney, Christine M. 1975- |
author_role | aut |
author_sort | Mahoney, Christine M. 1975- |
author_variant | c m m cm cmm |
building | Verbundindex |
bvnumber | BV041829197 |
classification_rvk | UM 3120 VE 8600 VG 9800 |
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ctrlnum | (OCoLC)874336796 (DE-599)BVBBV041829197 |
dewey-full | 543.65 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 543 - Analytical chemistry |
dewey-raw | 543.65 |
dewey-search | 543.65 |
dewey-sort | 3543.65 |
dewey-tens | 540 - Chemistry and allied sciences |
discipline | Chemie / Pharmazie Physik |
format | Electronic eBook |
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illustrated | Not Illustrated |
indexdate | 2024-07-10T01:06:22Z |
institution | BVB |
isbn | 9781118589243 9781118589250 9781118589335 |
language | English |
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publisher | Wiley |
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series2 | Wiley-Interscience series on mass spectrometry |
spelling | Mahoney, Christine M. 1975- Verfasser (DE-588)1038795605 aut Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney Hoboken, New Jersey Wiley 2013 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Wiley-Interscience series on mass spectrometry This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic bisacsh Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Clusterion (DE-588)4148106-9 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Clusterion (DE-588)4148106-9 s b DE-604 Erscheint auch als Druckausgabe 978-0-470-88605-2 https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 Verlag Volltext |
spellingShingle | Mahoney, Christine M. 1975- Cluster secondary ion mass spectrometry principles and applications Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic bisacsh Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Clusterion (DE-588)4148106-9 gnd |
subject_GND | (DE-588)4077346-2 (DE-588)4148106-9 |
title | Cluster secondary ion mass spectrometry principles and applications |
title_auth | Cluster secondary ion mass spectrometry principles and applications |
title_exact_search | Cluster secondary ion mass spectrometry principles and applications |
title_full | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
title_fullStr | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
title_full_unstemmed | Cluster secondary ion mass spectrometry principles and applications edited by Christine M. Mahoney |
title_short | Cluster secondary ion mass spectrometry |
title_sort | cluster secondary ion mass spectrometry principles and applications |
title_sub | principles and applications |
topic | Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic bisacsh Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Clusterion (DE-588)4148106-9 gnd |
topic_facet | Secondary electron emission Surfaces (Physics) SCIENCE / Chemistry / Analytic Chemie Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie Clusterion |
url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781118589335 |
work_keys_str_mv | AT mahoneychristinem clustersecondaryionmassspectrometryprinciplesandapplications |