Cluster secondary ion mass spectrometry: principles and applications
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Bibliographische Detailangaben
1. Verfasser: Mahoney, Christine M. 1975- (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Hoboken, New Jersey Wiley 2013
Schriftenreihe:Wiley-Interscience series on mass spectrometry
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Beschreibung:This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods
Beschreibung:1 Online-Ressource
ISBN:9781118589243
9781118589250
9781118589335

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