Haugstad, G. (2012). Atomic force microscopy: Exploring basic modes and advanced applications. Wiley.
Chicago Style (17th ed.) CitationHaugstad, Greg. Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications. Hoboken, NJ: Wiley, 2012.
MLA (9th ed.) CitationHaugstad, Greg. Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications. Wiley, 2012.
Warning: These citations may not always be 100% accurate.