Atomic force microscopy: exploring basic modes and advanced applications
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Hoboken, NJ
Wiley
2012
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Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | 1 Online-Ressource |
ISBN: | 9781118360668 9780470638828 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author | Haugstad, Greg 1963- |
author_GND | (DE-588)1027424546 |
author_facet | Haugstad, Greg 1963- |
author_role | aut |
author_sort | Haugstad, Greg 1963- |
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building | Verbundindex |
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dewey-search | 620/.5 |
dewey-sort | 3620 15 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik |
format | Electronic eBook |
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id | DE-604.BV041828993 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:06:21Z |
institution | BVB |
isbn | 9781118360668 9780470638828 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027273912 |
oclc_num | 810936286 |
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publishDate | 2012 |
publishDateSearch | 2012 |
publishDateSort | 2012 |
publisher | Wiley |
record_format | marc |
spelling | Haugstad, Greg 1963- Verfasser (DE-588)1027424546 aut Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad Hoboken, NJ Wiley 2012 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Atomic force microscopy fast Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 https://onlinelibrary.wiley.com/doi/book/10.1002/9781118360668 Verlag Volltext |
spellingShingle | Haugstad, Greg 1963- Atomic force microscopy exploring basic modes and advanced applications Atomic force microscopy fast Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
subject_GND | (DE-588)4274473-8 |
title | Atomic force microscopy exploring basic modes and advanced applications |
title_auth | Atomic force microscopy exploring basic modes and advanced applications |
title_exact_search | Atomic force microscopy exploring basic modes and advanced applications |
title_full | Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad |
title_fullStr | Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad |
title_full_unstemmed | Atomic force microscopy exploring basic modes and advanced applications Greg Haugstad |
title_short | Atomic force microscopy |
title_sort | atomic force microscopy exploring basic modes and advanced applications |
title_sub | exploring basic modes and advanced applications |
topic | Atomic force microscopy fast Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
topic_facet | Atomic force microscopy Rasterkraftmikroskopie |
url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781118360668 |
work_keys_str_mv | AT haugstadgreg atomicforcemicroscopyexploringbasicmodesandadvancedapplications |