Scanning probe microscopy in industrial applications: nanomechanical characterization
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Hoboken, NJ
Wiley
2014
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| Subjects: | |
| Online Access: | Cover |
| Item Description: | Angekündigt u.d.T.: Scanning probe microscopy for industrial applications |
| Physical Description: | XIX, 347 S. Ill., graph. Darst. |
| ISBN: | 9781118288238 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV041641859 | ||
| 003 | DE-604 | ||
| 005 | 20150113 | ||
| 007 | t | ||
| 008 | 140211s2014 ad|| |||| 00||| eng d | ||
| 010 | |a 2013009638 | ||
| 020 | |a 9781118288238 |c hardback |9 978-1-11-828823-8 | ||
| 035 | |a (OCoLC)889517160 | ||
| 035 | |a (DE-599)GBV745952518 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 |a DE-703 |a DE-29T | ||
| 050 | 0 | |a TA417.23 | |
| 082 | 0 | |a 620.1/127 | |
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 084 | |a UH 6320 |0 (DE-625)145762: |2 rvk | ||
| 245 | 1 | 0 | |a Scanning probe microscopy in industrial applications |b nanomechanical characterization |c ed. by Dalia G. Yablon |
| 246 | 1 | 3 | |a Scanning probe microscopy for industrial applications |
| 264 | 1 | |a Hoboken, NJ |b Wiley |c 2014 | |
| 300 | |a XIX, 347 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Angekündigt u.d.T.: Scanning probe microscopy for industrial applications | ||
| 650 | 0 | 7 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Industrie |0 (DE-588)4026779-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Nanostrukturiertes Material |0 (DE-588)4342626-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |D s |
| 689 | 0 | 1 | |a Nanostrukturiertes Material |0 (DE-588)4342626-8 |D s |
| 689 | 0 | 2 | |a Industrie |0 (DE-588)4026779-9 |D s |
| 689 | 0 | |8 2\p |5 DE-604 | |
| 700 | 1 | |a Yablon, Dalia |4 edt | |
| 856 | 4 | |u http://catalogimages.wiley.com/images/db/jimages/9781118288238.jpg |3 Cover | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027082642 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804151865184616448 |
|---|---|
| any_adam_object | |
| author2 | Yablon, Dalia |
| author2_role | edt |
| author2_variant | d y dy |
| author_facet | Yablon, Dalia |
| building | Verbundindex |
| bvnumber | BV041641859 |
| callnumber-first | T - Technology |
| callnumber-label | TA417 |
| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UH 6310 UH 6320 |
| ctrlnum | (OCoLC)889517160 (DE-599)GBV745952518 |
| dewey-full | 620.1/127 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/127 |
| dewey-search | 620.1/127 |
| dewey-sort | 3620.1 3127 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01859nam a2200469 c 4500</leader><controlfield tag="001">BV041641859</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20150113 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">140211s2014 ad|| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2013009638</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118288238</subfield><subfield code="c">hardback</subfield><subfield code="9">978-1-11-828823-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)889517160</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBV745952518</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA417.23</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/127</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6320</subfield><subfield code="0">(DE-625)145762:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning probe microscopy in industrial applications</subfield><subfield code="b">nanomechanical characterization</subfield><subfield code="c">ed. by Dalia G. Yablon</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Scanning probe microscopy for industrial applications</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, NJ</subfield><subfield code="b">Wiley</subfield><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIX, 347 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Angekündigt u.d.T.: Scanning probe microscopy for industrial applications</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Industrie</subfield><subfield code="0">(DE-588)4026779-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanostrukturiertes Material</subfield><subfield code="0">(DE-588)4342626-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Nanostrukturiertes Material</subfield><subfield code="0">(DE-588)4342626-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Industrie</subfield><subfield code="0">(DE-588)4026779-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yablon, Dalia</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://catalogimages.wiley.com/images/db/jimages/9781118288238.jpg</subfield><subfield code="3">Cover</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027082642</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV041641859 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T01:01:36Z |
| institution | BVB |
| isbn | 9781118288238 |
| language | English |
| lccn | 2013009638 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027082642 |
| oclc_num | 889517160 |
| open_access_boolean | |
| owner | DE-11 DE-703 DE-29T |
| owner_facet | DE-11 DE-703 DE-29T |
| physical | XIX, 347 S. Ill., graph. Darst. |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | Wiley |
| record_format | marc |
| spelling | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon Scanning probe microscopy for industrial applications Hoboken, NJ Wiley 2014 XIX, 347 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Angekündigt u.d.T.: Scanning probe microscopy for industrial applications Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Industrie (DE-588)4026779-9 gnd rswk-swf Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s Nanostrukturiertes Material (DE-588)4342626-8 s Industrie (DE-588)4026779-9 s 2\p DE-604 Yablon, Dalia edt http://catalogimages.wiley.com/images/db/jimages/9781118288238.jpg Cover 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Scanning probe microscopy in industrial applications nanomechanical characterization Rastersondenmikroskopie (DE-588)4330328-6 gnd Industrie (DE-588)4026779-9 gnd Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)4026779-9 (DE-588)4342626-8 (DE-588)4143413-4 |
| title | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_alt | Scanning probe microscopy for industrial applications |
| title_auth | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_exact_search | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_full | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon |
| title_fullStr | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon |
| title_full_unstemmed | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon |
| title_short | Scanning probe microscopy in industrial applications |
| title_sort | scanning probe microscopy in industrial applications nanomechanical characterization |
| title_sub | nanomechanical characterization |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd Industrie (DE-588)4026779-9 gnd Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| topic_facet | Rastersondenmikroskopie Industrie Nanostrukturiertes Material Aufsatzsammlung |
| url | http://catalogimages.wiley.com/images/db/jimages/9781118288238.jpg |
| work_keys_str_mv | AT yablondalia scanningprobemicroscopyinindustrialapplicationsnanomechanicalcharacterization AT yablondalia scanningprobemicroscopyforindustrialapplications |