Scanning probe microscopy in industrial applications: nanomechanical characterization
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Hoboken, NJ
Wiley
2014
|
| Schlagworte: | |
| Online-Zugang: | Cover |
| Beschreibung: | Angekündigt u.d.T.: Scanning probe microscopy for industrial applications |
| Beschreibung: | XIX, 347 S. Ill., graph. Darst. |
| ISBN: | 9781118288238 |
Internformat
MARC
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| 245 | 1 | 0 | |a Scanning probe microscopy in industrial applications |b nanomechanical characterization |c ed. by Dalia G. Yablon |
| 246 | 1 | 3 | |a Scanning probe microscopy for industrial applications |
| 264 | 1 | |a Hoboken, NJ |b Wiley |c 2014 | |
| 300 | |a XIX, 347 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| bvnumber | BV041641859 |
| callnumber-first | T - Technology |
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| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UH 6310 UH 6320 |
| ctrlnum | (OCoLC)889517160 (DE-599)GBV745952518 |
| dewey-full | 620.1/127 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/127 |
| dewey-search | 620.1/127 |
| dewey-sort | 3620.1 3127 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
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| indexdate | 2024-07-10T01:01:36Z |
| institution | BVB |
| isbn | 9781118288238 |
| language | English |
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| spelling | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon Scanning probe microscopy for industrial applications Hoboken, NJ Wiley 2014 XIX, 347 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Angekündigt u.d.T.: Scanning probe microscopy for industrial applications Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Industrie (DE-588)4026779-9 gnd rswk-swf Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s Nanostrukturiertes Material (DE-588)4342626-8 s Industrie (DE-588)4026779-9 s 2\p DE-604 Yablon, Dalia edt http://catalogimages.wiley.com/images/db/jimages/9781118288238.jpg Cover 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Scanning probe microscopy in industrial applications nanomechanical characterization Rastersondenmikroskopie (DE-588)4330328-6 gnd Industrie (DE-588)4026779-9 gnd Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)4026779-9 (DE-588)4342626-8 (DE-588)4143413-4 |
| title | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_alt | Scanning probe microscopy for industrial applications |
| title_auth | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_exact_search | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_full | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon |
| title_fullStr | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon |
| title_full_unstemmed | Scanning probe microscopy in industrial applications nanomechanical characterization ed. by Dalia G. Yablon |
| title_short | Scanning probe microscopy in industrial applications |
| title_sort | scanning probe microscopy in industrial applications nanomechanical characterization |
| title_sub | nanomechanical characterization |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd Industrie (DE-588)4026779-9 gnd Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| topic_facet | Rastersondenmikroskopie Industrie Nanostrukturiertes Material Aufsatzsammlung |
| url | http://catalogimages.wiley.com/images/db/jimages/9781118288238.jpg |
| work_keys_str_mv | AT yablondalia scanningprobemicroscopyinindustrialapplicationsnanomechanicalcharacterization AT yablondalia scanningprobemicroscopyforindustrialapplications |