Electrical Characterization of HfO2-based embedded ReRAM-Structures: A comperative Study:

Photonik

Saved in:
Bibliographic Details
Main Author: Kubotsch, Steffen (Author)
Format: Thesis Book
Language:English
Published: Wildau TH 2013
Subjects:
Summary:Photonik
Physical Description:61 S. Ill., graph. Darst. 1 CD-ROM

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!