Frontiers in Optical Methods: Nano-Characterization and coherent control
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2014
|
| Schriftenreihe: | Springer series in optical sciences
180 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Klappentext |
| Beschreibung: | XII, 228 S. Ill., graph. Darst. |
| ISBN: | 9783642405938 |
Internformat
MARC
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| 005 | 20150319 | ||
| 007 | t | ||
| 008 | 140109s2014 ad|| |||| 00||| eng d | ||
| 020 | |a 9783642405938 |9 978-3-642-40593-8 | ||
| 035 | |a (OCoLC)870187097 | ||
| 035 | |a (DE-599)BVBBV041550385 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 |a DE-83 |a DE-703 |a DE-29T | ||
| 084 | |a UP 9000 |0 (DE-625)146451: |2 rvk | ||
| 245 | 1 | 0 | |a Frontiers in Optical Methods |b Nano-Characterization and coherent control |c Ken-ichi Shudo ... ed. |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 2014 | |
| 300 | |a XII, 228 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in optical sciences |v 180 | |
| 650 | 0 | 7 | |a Optische Spektroskopie |0 (DE-588)4043680-9 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Optische Spektroskopie |0 (DE-588)4043680-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Shudo, Ken-Ichi |e Sonstige |0 (DE-588)1046202987 |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-642-40594-5 |
| 830 | 0 | |a Springer series in optical sciences |v 180 |w (DE-604)BV000000237 |9 180 | |
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| 856 | 4 | 2 | |m Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026996157&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |3 Klappentext |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-026996157 | ||
Datensatz im Suchindex
| _version_ | 1804151659054497792 |
|---|---|
| adam_text | Contents
β
І
Introduction:
Ultra-Fast Response of Ultra-Thin Materials
on Solid Surfaces
..................................... 1
Ken-ichi Shudo
1.1
Introduction
..................................... 1
1.1.1
Photoabsorption
............................. 1
1.1.2
Electronic Bands
............................. 5
1.2
Surface Systems
.................................. 9
1.2.1
Surface Reflectance
........................... 12
1.2.2
Calculation
................................. 13
1.2.3
Example and Interpretation
..................... 16
1.3
Ultrafast Measurement
.............................. 18
1.3.1
Monoîayer
Film of Organic Molecule
.............. 18
1.3.2
Experimental example
......................... 19
1.4
Summary
....................................... 21
1.5
Acknowledgment
.................................. 22
References
.......................................... 24
Part I Reflectance Spectroscopy
2
Real-Time
Analysis of Initial Oxidation Process on Si(OOl)
by Means of Surface Differential Reflectance Spectroscopy
and Reflectance Difference Spectroscopy
.................... 29
Shin-ya Ohno, Ken-ichi Shudo and Masatoshi Tanaka
2.1
Introduction
..................................... 29
2.2
Experimental
..................................... 30
2.2.1
SDR Measurement
........................... 30
2.2.2
RDS Measurement
........................... 32
2.2.3
Formulation of the Reflectance
in a Three-Phase Model
........................ 33
2.2.4
Advantages of the Use of SDR and RDS
............ 35
vu
viii Contents
2.3
Analysis of Initial Oxidation Reaction on SiiOOl)
........... 36
2.3.1
SDR Results
................................ 36
2.3.2
RDS Results
................................ 38
2.3.3
Comparison of the Results Obtained with SDR
and RDS
.................................. 39
2.3.4
Origin of the Activation Energy
.................. 40
2.3.5
Qualitative Aspects of the Reflectance Spectra
........ 41
2.3.6
Adsorption Structure, Identification of the Adsorption
Sites, and Characterization of the Interface Structure.
... 42
2.4
Summary and Outlook
.............................. 43
2.5
Acknowledgement
................................. 43
References
.......................................... 43
3
Development of In-Vacuum Microscope Under High Pressure
and Its Applications
................................... 45
Takao Nanba
3.1
Introduction
..................................... 45
3.2
Development of In-UHV Microscope
.................... 47
3.2.1
Why In-UHV Microscope
...................... 47
3.2.2
Specifications of In-UHV Microscope
.............. 48
3.2.3
Diamond Anvil Cell
.......................... 49
3.2.4
Spatial Resolution
............................ 49
3.2.5
Available Spectral Regions
..................... 50
3.3
Optical Properties of Solids Under Pressure
............... 51
3.3.1
Hydrogen Order-Disorder Transition of Ice
.......... 51
3.3.2
Nd2Ir2O7
.................................. 55
3.3.3
Pb2Ir2O7
.................................. 59
3.4
Conclusions
..................................... 60
References
.......................................... 61
4
Infrared and Terahertz Synchrotron Radiation: Optics
and Applications
..................................... 63
Shin-ichi Kimura
4.1
Introduction
..................................... 63
4.2
Principle of Three-Dimensional Magic Mirror Optics
for TH^R SR
................................... 64
4.3
IR/THz Beamline Optics at UVSOR-II
.................. 68
4.4
IR/THz Beamline Optics at UVSOR-II
.................. 69
4.4.1
THz/IR Reflection/Absorption Spectroscopy
Using SR
.................................. 72
4.4.2
THzAR Microspectroscopy Using SR
.............. 73
4.5
Application of THz Spectroscopy Using SR:
Temperature-Dependent THz Spectra of SmB6
............. 75
Contents ix
4.6 Applications
of THz Microspectroscopy Using
SR..........
77
4.6.1
Experimental Procedure of THz Spectroscopy
Under High Pressure
.......................... 77
4.6.2
Electronic Structure of SmS Under High Pressure
...... 78
4.7
Conclusion and Outlook
............................. 80
References
.......................................... 80
Part II Ultrafast and Coherent Measurement
5
Time-Resolved
Х
-Ray Diffraction Studies of Coherent Lattice
Dynamics Using Synchrotron Radiation
.................... 85
Yoshihito Tanaka
5.1
Introduction
..................................... 85
5.2
Synchrotron Radiation
.............................. 86
5.2.1
Present Status of SR Facilities
................... 86
5.2.2
Characteristic Features of SR
.................... 87
5.3
Time-Resolved
Х
-Ray Diffraction
...................... 88
5.3.1
Time-Resolved Measurement Method
.............. 89
5.3.2
Observation of Lattice Dynamics with X-Ray
Diffraction
................................. 90
5.4
Equipment Components and the Techniques
............... 93
5.4.1
Equipment Components
........................ 93
5.4.2
Timing Control Technique Between Laser
and SR Pulses
............................... 93
5.5
Examples of Observation of Lattice Deformation
and Phonons
..................................... 97
5.5.1
Acoustic Pulses and the Echoes
.................. 97
5.5.2
Acoustic Phonons
............................ 99
5.5.3
Optical Phonons
............................. 100
5.6
Summary and Perspectives
........................... 101
References
.......................................... 102
6
Coherent Phonon Dynamics in Carbon Nanotubes
............ 105
Keiko
Kato,
Katsuya Oguri and Masahiro Kitajima
6.1
Introduction
..................................... 105
6.2
Carbon Nanotube
.................................. 106
6.2.1
Electronic Structure
........................... 107
6.2.2
Phonon
................................... 108
6.3
Coherent Phonon
................................... 112
6.3.1
Detection of Coherent Phonon
................... 113
6.3.2
Experiment
................................. 114
x
Contents
6.4
Anisotropy of Coherent Phonons in Aligned SWCNT
........ 115
6.4.1
Sample Preparation of Aligned SWCNT
............ 115
6.4.2
Antenna Effect of the Optical Transition
............ 115
6.4.3
Transient and
Anisotropie
Reflectivity Measurements
in Aligned SWCNTs
.......................... 116
6.4.4
Antenna Effect of Coherent Phonons
............... 118
6.4.5
Polarization Dependence of Coherent Phonons
........ 118
6.5
Coherent Phonons in Metallic SWCNTs
.................. 122
6.5.1
Experiment
................................. 122
6.5.2
Results
.................................... 122
6.6
Summary
....................................... 124
6.7
Acknowledgment
.................................. 125
References
.......................................... 125
7
Generation and Observation of GHz-THz Acoustic Waves in
Thin Films and
Microstructures
Using Optical Methods
........ 129
Osamu
Matsuda and Oliver B. Wright
7.1
Introduction
..................................... 129
7.2
Picosecond Laser Ultrasonics
......................... 130
7.2.1
Basic Experimental Setup
...................... 130
7.2.2
Interferometrie
Setup
.......................... 132
7.2.3
Other Methods
.............................. 133
7.3
Excitation and Detection of Bulk Acoustic Waves
........... 133
7.3.1
Thin Metal Films
............................ 134
7.3.2
Semiconductor Quantum Wells
................... 136
7.3.3
Shear Acoustic Waves
......................... 138
7.4
Excitation and Imaging of Surface Acoustic Waves
.......... 141
7.4.1
Glasses and Crystals
.......................... 142
7.4.2
Phononic Crystals
............................ 143
7.4.3
SAW Imaging Through the Photoelastic Effect
........ 145
7.5
Summary
....................................... 146
References
.......................................... 147
8
Sate-of-the-Art of Terahertz Science and Technology
.......... 153
Masayoshi Tonouchi
8.1
Introduction
..................................... 153
8.2
New Twist in THz Science and Technology
............... 154
8.2.1
THz Sources
................................ 154
8.2.2
THz Detectors
.............................. 157
8.2.3
THz Spectrometer and Imaging Systems
............ 158
8.3
New Trends in THz Applications
...................... 159
8.3.1
Conservation of Historic and Artistic Works
......... 159
8.3.2
THz Emission Spectroscopy
..................... 161
8.3.3
LTEM Application to LSI Defect Analysis
.......... 163
Contents xi
8.4
Summary
....................................... 164
References
.......................................... 165
9
Broadband Terahertz Spectroscopy of Thin Films
............. 167
Ikufumui Katayama and Masaaki Ashida
9.1
Introduction
..................................... 167
9.2
Generation and Detection of Terahertz Electric Fields
........ 168
9.2.1
Photoconducting Antenna
....................... 169
9.2.2
Optical Rectification and Electro-Optic Sampling
...... 171
9.3
Terahertz Time-Domain Spectroscopy
................... 172
9.4
Broadband Terahertz
TDS
........................... 174
9.4.1
Photoconducting Antenna
....................... 174
9.4.2
Electro-Optic Crystal
.......................... 175
9.5
Applications of Broadband THz-TDS
.................... 178
9.5.1
Characterization of Dielectric Thin Films
............ 178
9.5.2
Light-Pump Terahertz Probe Spectroscopy
........... 180
9.6
Conclusion
...................................... 182
References
.......................................... 183
Part
Ш
THz-Techmrtogy
10
Terahertz Light Source Based on Synchrotron Radiation
....... 187
Masahiro Katoh
10.1
Introduction
..................................... 187
10.2
What is a Synchrotron Radiation Source?
................. 188
10.3
Characteristics of Synchrotron Radiation
................. 189
10.4
CSR
........................................... 190
10.4.1
What is CSR?
............................... 190
10.4.2
CSR from a Linear Accelerator
.................. 191
10.4.3
CSR from an Electron Storage Ring
............... 192
10.5
Summary
....................................... 194
References
.......................................... 196
11
Single-Photon Counting and Passive Microscopy of Terahertz
Radiation
........................................... 197
Kenji ikushima
11.1
Introduction
..................................... 197
11.2
Challenges in Passive THz Sensing
..................... 198
11.3
Photon Counting of THz Radiation
..................... 199
11.3.1
Sensitivity of Conventional Detectors
.............. 199
113.2
Charge-Sensitive Single THz Photon Detectors
........ 200
11.4
Photon-Counting THz Imaging
........................ 205
xii Contents
11.4.1
Scanning Confocal THz Microscope...............
205
11.4.2 THz
Imaging of
Quantum Hall
Effect Devices
........ 206
11.5
Future Perspectives
................................ 211
References
.......................................... 211
12
Material Evaluation with Optical Measurement Systems:
Focusing on Terahertz Spectroscopy
....................... 213
Kei
ko Kitagishi
12.1
Introduction
..................................... 213
12.2
Terahertz
Spectroscopie
System
....................... 213
12.2.1
Terahertz-Time Domain
Spectroscopie
System
for the Transmission Measurements
............... 213
12.2.2
Terahertz-Time Domain
Spectroscopie
System
for the Reflection Measurements
.................. 217
12.2.3
Optical Modification for the Transmission
Measurements of the Samples with High
Refractive Indices
............................ 219
12.3
Material Evaluation with Visible, NIR, and
Light-Scattering Spectrophotometers
.................... 221
12.3.1
Color Evaluation and Estimation of Membrane
Thickness with a Fiber-Coupled Spectrophotometer
in the Visible and NIR Region
................... 222
12.3.2
Inspection of Gas Regarding Production
of Semiconductors with FT-IR
................... 223
12.3.3
Light-Scattering Spectrophotometers
............... 223
References
.......................................... 223
Index
................................................ 225
Springer
Series in Optical Sciences
Ken-khi Shudo
■
Ikufumui Katayama
·
Shin-ya Ohno Editors
Frontiers in Optical Methods
Nano-Characterization and Coherent Control
optical responses, terahertz and phonon studies, super-sensitive surface and
high-pressure spectroscopy,combination of visible and x-ray photonics. Several related
areas at the cutting edge tit measurement technology and materials science are included.
1
his book is parti) based on well-cited review articles in the Japanese language in special
volumes of the Journal of the Vacuum Society
ai
japan.
Physics
ISSN0342-4m
ISBN
978-3-642-40593-8
9ІІ783642
>
spnnger.com
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| id | DE-604.BV041550385 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:58:20Z |
| institution | BVB |
| isbn | 9783642405938 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026996157 |
| oclc_num | 870187097 |
| open_access_boolean | |
| owner | DE-11 DE-83 DE-703 DE-29T |
| owner_facet | DE-11 DE-83 DE-703 DE-29T |
| physical | XII, 228 S. Ill., graph. Darst. |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Frontiers in Optical Methods Nano-Characterization and coherent control Ken-ichi Shudo ... ed. Berlin [u.a.] Springer 2014 XII, 228 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 180 Optische Spektroskopie (DE-588)4043680-9 gnd rswk-swf Optische Spektroskopie (DE-588)4043680-9 s DE-604 Shudo, Ken-Ichi Sonstige (DE-588)1046202987 oth Erscheint auch als Online-Ausgabe 978-3-642-40594-5 Springer series in optical sciences 180 (DE-604)BV000000237 180 Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026996157&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026996157&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Klappentext |
| spellingShingle | Frontiers in Optical Methods Nano-Characterization and coherent control Springer series in optical sciences Optische Spektroskopie (DE-588)4043680-9 gnd |
| subject_GND | (DE-588)4043680-9 |
| title | Frontiers in Optical Methods Nano-Characterization and coherent control |
| title_auth | Frontiers in Optical Methods Nano-Characterization and coherent control |
| title_exact_search | Frontiers in Optical Methods Nano-Characterization and coherent control |
| title_full | Frontiers in Optical Methods Nano-Characterization and coherent control Ken-ichi Shudo ... ed. |
| title_fullStr | Frontiers in Optical Methods Nano-Characterization and coherent control Ken-ichi Shudo ... ed. |
| title_full_unstemmed | Frontiers in Optical Methods Nano-Characterization and coherent control Ken-ichi Shudo ... ed. |
| title_short | Frontiers in Optical Methods |
| title_sort | frontiers in optical methods nano characterization and coherent control |
| title_sub | Nano-Characterization and coherent control |
| topic | Optische Spektroskopie (DE-588)4043680-9 gnd |
| topic_facet | Optische Spektroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026996157&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026996157&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT shudokenichi frontiersinopticalmethodsnanocharacterizationandcoherentcontrol |