APA (7th ed.) Citation

Franco, J. (2014). Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. https://doi.org/10.1007/978-94-007-7663-0

Chicago Style (17th ed.) Citation

Franco, Jacopo. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. 2014. https://doi.org/10.1007/978-94-007-7663-0.

MLA (9th ed.) Citation

Franco, Jacopo. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. 2014. https://doi.org/10.1007/978-94-007-7663-0.