Flash Memories: Economic Principles of Performance, Cost and Reliability Optimization
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
2014
|
| Schriftenreihe: | Springer Series in Advanced Microelectronics
40 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext |
| Beschreibung: | The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book. Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined. Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process. The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap. Flash Memories offers an opportunity to enhance your understanding of product development key topics such as: · Reliability optimization of flash memories is all about threshold voltage margin understanding and definition; · Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window; · Technical characteristics are translated into quantitative performance indicators; · Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; · Cost, density, performance and durability values are combined into a common factor – performance indicator - which fulfills the application requirements |
| Beschreibung: | 1 Online-Ressource (XXIV, 268 p.) 185 illus |
| ISBN: | 9789400760820 |
| DOI: | 10.1007/978-94-007-6082-0 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV041471095 | ||
| 003 | DE-604 | ||
| 005 | 20131223 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 131210s2014 |||| o||u| ||||||eng d | ||
| 020 | |a 9789400760820 |9 978-94-007-6082-0 | ||
| 024 | 7 | |a 10.1007/978-94-007-6082-0 |2 doi | |
| 035 | |a (OCoLC)874381872 | ||
| 035 | |a (DE-599)BVBBV041471095 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-Aug4 |a DE-92 |a DE-634 |a DE-859 |a DE-898 |a DE-573 |a DE-861 |a DE-706 |a DE-863 |a DE-862 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 100 | 1 | |a Richter, Detlev |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Flash Memories |b Economic Principles of Performance, Cost and Reliability Optimization |c by Detlev Richter |
| 264 | 1 | |c 2014 | |
| 300 | |a 1 Online-Ressource (XXIV, 268 p.) |b 185 illus | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Advanced Microelectronics |v 40 | |
| 500 | |a The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book. Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined. Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. | ||
| 500 | |a A graphical representation based on trend lines is introduced to support a requirement based product development process. | ||
| 500 | |a The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap. Flash Memories offers an opportunity to enhance your understanding of product development key topics such as: · Reliability optimization of flash memories is all about threshold voltage margin understanding and definition; · Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window; · Technical characteristics are translated into quantitative performance indicators; · Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; · Cost, density, | ||
| 500 | |a performance and durability values are combined into a common factor – performance indicator - which fulfills the application requirements | ||
| 505 | 0 | |a 1 Introduction -- 2 Fundamentals of Non-Volatile Memories -- 3 Performance Figures of Non-Volatile Memories -- 4 Fundamentals of Reliability for Flash Memories -- 5 Memory based System Development and Optimization -- 6 Memory Optimization - Key Performance Indicator Methodology -- 7 System Optimization based on Performance Indicator Models -- 8 Conclusion and Outlook -- 9 References -- Recent Publications by the Author | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Systems engineering | |
| 650 | 4 | |a Electronic Circuits and Devices | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Semiconductors | |
| 650 | 0 | 7 | |a Flash-Speicher |0 (DE-588)4518714-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Leistungsbewertung |0 (DE-588)4167271-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Flash-Speicher |0 (DE-588)4518714-9 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | 2 | |a Leistungsbewertung |0 (DE-588)4167271-9 |D s |
| 689 | 0 | |8 2\p |5 DE-604 | |
| 830 | 0 | |a Springer Series in Advanced Microelectronics |v 40 |w (DE-604)BV041461435 |9 40 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-94-007-6082-0 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-026917237 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-94-007-6082-0 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
Datensatz im Suchindex
| DE-BY-FWS_katkey | 1015602 |
|---|---|
| _version_ | 1824553635997024257 |
| any_adam_object | |
| author | Richter, Detlev |
| author_facet | Richter, Detlev |
| author_role | aut |
| author_sort | Richter, Detlev |
| author_variant | d r dr |
| building | Verbundindex |
| bvnumber | BV041471095 |
| collection | ZDB-2-ENG |
| contents | 1 Introduction -- 2 Fundamentals of Non-Volatile Memories -- 3 Performance Figures of Non-Volatile Memories -- 4 Fundamentals of Reliability for Flash Memories -- 5 Memory based System Development and Optimization -- 6 Memory Optimization - Key Performance Indicator Methodology -- 7 System Optimization based on Performance Indicator Models -- 8 Conclusion and Outlook -- 9 References -- Recent Publications by the Author |
| ctrlnum | (OCoLC)874381872 (DE-599)BVBBV041471095 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-94-007-6082-0 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>05552nmm a2200697zcb4500</leader><controlfield tag="001">BV041471095</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20131223 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">131210s2014 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789400760820</subfield><subfield code="9">978-94-007-6082-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-94-007-6082-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)874381872</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041471095</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-862</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Richter, Detlev</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Flash Memories</subfield><subfield code="b">Economic Principles of Performance, Cost and Reliability Optimization</subfield><subfield code="c">by Detlev Richter</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XXIV, 268 p.)</subfield><subfield code="b">185 illus</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Advanced Microelectronics</subfield><subfield code="v">40</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost aspects of 3D integration of flash memory are treated in this book. Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined. Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. </subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">A graphical representation based on trend lines is introduced to support a requirement based product development process. </subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap. Flash Memories offers an opportunity to enhance your understanding of product development key topics such as: · Reliability optimization of flash memories is all about threshold voltage margin understanding and definition; · Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window; · Technical characteristics are translated into quantitative performance indicators; · Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; · Cost, density, </subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">performance and durability values are combined into a common factor – performance indicator - which fulfills the application requirements</subfield></datafield><datafield tag="505" ind1="0" ind2=" "><subfield code="a">1 Introduction -- 2 Fundamentals of Non-Volatile Memories -- 3 Performance Figures of Non-Volatile Memories -- 4 Fundamentals of Reliability for Flash Memories -- 5 Memory based System Development and Optimization -- 6 Memory Optimization - Key Performance Indicator Methodology -- 7 System Optimization based on Performance Indicator Models -- 8 Conclusion and Outlook -- 9 References -- Recent Publications by the Author</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Flash-Speicher</subfield><subfield code="0">(DE-588)4518714-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Leistungsbewertung</subfield><subfield code="0">(DE-588)4167271-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Flash-Speicher</subfield><subfield code="0">(DE-588)4518714-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Leistungsbewertung</subfield><subfield code="0">(DE-588)4167271-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Advanced Microelectronics</subfield><subfield code="v">40</subfield><subfield code="w">(DE-604)BV041461435</subfield><subfield code="9">40</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-026917237</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-94-007-6082-0</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV041471095 |
| illustrated | Not Illustrated |
| indexdate | 2025-02-20T06:39:01Z |
| institution | BVB |
| isbn | 9789400760820 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026917237 |
| oclc_num | 874381872 |
| open_access_boolean | |
| owner | DE-Aug4 DE-92 DE-634 DE-859 DE-898 DE-BY-UBR DE-573 DE-861 DE-706 DE-863 DE-BY-FWS DE-862 DE-BY-FWS |
| owner_facet | DE-Aug4 DE-92 DE-634 DE-859 DE-898 DE-BY-UBR DE-573 DE-861 DE-706 DE-863 DE-BY-FWS DE-862 DE-BY-FWS |
| physical | 1 Online-Ressource (XXIV, 268 p.) 185 illus |
| psigel | ZDB-2-ENG |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| record_format | marc |
| series | Springer Series in Advanced Microelectronics |
| series2 | Springer Series in Advanced Microelectronics |
| spellingShingle | Richter, Detlev Flash Memories Economic Principles of Performance, Cost and Reliability Optimization Springer Series in Advanced Microelectronics 1 Introduction -- 2 Fundamentals of Non-Volatile Memories -- 3 Performance Figures of Non-Volatile Memories -- 4 Fundamentals of Reliability for Flash Memories -- 5 Memory based System Development and Optimization -- 6 Memory Optimization - Key Performance Indicator Methodology -- 7 System Optimization based on Performance Indicator Models -- 8 Conclusion and Outlook -- 9 References -- Recent Publications by the Author Physics Systems engineering Electronic Circuits and Devices Circuits and Systems Solid State Physics Semiconductors Flash-Speicher (DE-588)4518714-9 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Leistungsbewertung (DE-588)4167271-9 gnd |
| subject_GND | (DE-588)4518714-9 (DE-588)4059245-5 (DE-588)4167271-9 (DE-588)4113937-9 |
| title | Flash Memories Economic Principles of Performance, Cost and Reliability Optimization |
| title_auth | Flash Memories Economic Principles of Performance, Cost and Reliability Optimization |
| title_exact_search | Flash Memories Economic Principles of Performance, Cost and Reliability Optimization |
| title_full | Flash Memories Economic Principles of Performance, Cost and Reliability Optimization by Detlev Richter |
| title_fullStr | Flash Memories Economic Principles of Performance, Cost and Reliability Optimization by Detlev Richter |
| title_full_unstemmed | Flash Memories Economic Principles of Performance, Cost and Reliability Optimization by Detlev Richter |
| title_short | Flash Memories |
| title_sort | flash memories economic principles of performance cost and reliability optimization |
| title_sub | Economic Principles of Performance, Cost and Reliability Optimization |
| topic | Physics Systems engineering Electronic Circuits and Devices Circuits and Systems Solid State Physics Semiconductors Flash-Speicher (DE-588)4518714-9 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Leistungsbewertung (DE-588)4167271-9 gnd |
| topic_facet | Physics Systems engineering Electronic Circuits and Devices Circuits and Systems Solid State Physics Semiconductors Flash-Speicher Zuverlässigkeit Leistungsbewertung Hochschulschrift |
| url | https://doi.org/10.1007/978-94-007-6082-0 |
| volume_link | (DE-604)BV041461435 |
| work_keys_str_mv | AT richterdetlev flashmemorieseconomicprinciplesofperformancecostandreliabilityoptimization |