Trace-Based Post-Silicon Validation for VLSI Circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
2014
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| Schriftenreihe: | Lecture Notes in Electrical Engineering
252 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext Inhaltsverzeichnis Abstract |
| Beschreibung: | This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. · Provides a comprehensive summary of state-of-the-art on post-silicon validation; · Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; · Illustrate key concepts and algorithms with real examples. |
| Beschreibung: | 1 Online-Ressource (XV, 108 p.) 59 illus., 38 illus. in color |
| ISBN: | 9783319005331 |
| DOI: | 10.1007/978-3-319-00533-1 |
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| 500 | |a This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. · Provides a comprehensive summary of state-of-the-art on post-silicon validation; · Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; · Illustrate key concepts and algorithms with real examples. | ||
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Datensatz im Suchindex
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| adam_text | TRACE-BASED POST-SILICON VALIDATION FOR VLSI CIRCUITS
/ LIU, XIAO
: 2014
TABLE OF CONTENTS / INHALTSVERZEICHNIS
INTRODUCTION
STATE OF THE ART ON POST-SILICON VALIDATION
SIGNAL SELECTION FOR VISIBILITY ENHANCEMENT
MULTIPLEXED TRACING FOR DESIGN ERROR
TRACING FOR ELECTRICAL ERROR
REUSING TEST ACCESS MECHANISMS
INTERCONNECTION FABRIC FOR FLEXIBLE TRACING
INTERCONNECTION FABRIC FOR SYSTEMATIC TRACING
CONCLUSION
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
TRACE-BASED POST-SILICON VALIDATION FOR VLSI CIRCUITS
/ LIU, XIAO
: 2014
ABSTRACT / INHALTSTEXT
THIS BOOK FIRST PROVIDES A COMPREHENSIVE COVERAGE OF STATE-OF-THE-ART
VALIDATION SOLUTIONS BASED ON REAL-TIME SIGNAL TRACING TO GUARANTEE THE
CORRECTNESS OF VLSI CIRCUITS. THE AUTHORS DISCUSS SEVERAL KEY
CHALLENGES IN POST-SILICON VALIDATION AND PROVIDE AUTOMATED SOLUTIONS
THAT ARE SYSTEMATIC AND COST-EFFECTIVE. A SERIES OF AUTOMATIC TRACING
SOLUTIONS AND INNOVATIVE DESIGN FOR DEBUG (DFD) TECHNIQUES ARE
DESCRIBED, INCLUDING TECHNIQUES FOR TRACE SIGNAL SELECTION FOR ENHANCING
VISIBILITY OF FUNCTIONAL ERRORS, A MULTIPLEXED SIGNAL TRACING STRATEGY
FOR IMPROVING FUNCTIONAL ERROR DETECTION, A TRACING SOLUTION FOR
DEBUGGING ELECTRICAL ERRORS, AN INTERCONNECTION FABRIC FOR INCREASING
DATA BANDWIDTH AND SUPPORTING MULTI-CORE DEBUG, AN INTERCONNECTION
FABRIC DESIGN AND OPTIMIZATION TECHNIQUE TO INCREASE TRANSFER
FLEXIBILITY AND A DFD DESIGN AND ASSOCIATED TRACING SOLUTION FOR
IMPROVING DEBUG EFFICIENCY AND EXPANDING TRACING WINDOW. THE SOLUTIONS
PRESENTED IN THIS BOOK IMPROVE THE VALIDATION QUALITY OF VLSI CIRCUITS,
AND ULTIMATELY ENABLE THE DESIGN AND FABRICATION OF RELIABLE ELECTRONIC
DEVICES. PROVIDES A COMPREHENSIVE SUMMARY OF
STATE-OF-THE-ART ON POST-SILICON VALIDATION; OFFERS
AUTOMATED SOLUTIONS THAT ARE SYSTEMATIC AND COST-EFFECTIVE FOR
POST-SILICON VALIDATION, FROM TRACE SIGNAL SELECTION TO TRACE DATA
TRANSFER; ILLUSTRATE KEY CONCEPTS AND ALGORITHMS WITH
REAL EXAMPLES.
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
| any_adam_object | 1 |
| author | Liu, Xiao |
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| author_role | aut |
| author_sort | Liu, Xiao |
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| contents | Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion |
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| dewey-sort | 3621.3815 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-319-00533-1 |
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| id | DE-604.BV041470910 |
| illustrated | Illustrated |
| indexdate | 2024-08-01T10:56:00Z |
| institution | BVB |
| isbn | 9783319005331 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026917053 |
| oclc_num | 869827630 |
| open_access_boolean | |
| owner | DE-Aug4 DE-92 DE-634 DE-859 DE-898 DE-BY-UBR DE-573 DE-861 DE-706 DE-863 DE-BY-FWS DE-862 DE-BY-FWS |
| owner_facet | DE-Aug4 DE-92 DE-634 DE-859 DE-898 DE-BY-UBR DE-573 DE-861 DE-706 DE-863 DE-BY-FWS DE-862 DE-BY-FWS |
| physical | 1 Online-Ressource (XV, 108 p.) 59 illus., 38 illus. in color |
| psigel | ZDB-2-ENG |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| record_format | marc |
| series | Lecture Notes in Electrical Engineering |
| series2 | Lecture Notes in Electrical Engineering |
| spellingShingle | Liu, Xiao Trace-Based Post-Silicon Validation for VLSI Circuits Lecture Notes in Electrical Engineering Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion Engineering Computer science Systems engineering Circuits and Systems Processor Architectures Semiconductors Informatik Ingenieurwissenschaften |
| title | Trace-Based Post-Silicon Validation for VLSI Circuits |
| title_auth | Trace-Based Post-Silicon Validation for VLSI Circuits |
| title_exact_search | Trace-Based Post-Silicon Validation for VLSI Circuits |
| title_full | Trace-Based Post-Silicon Validation for VLSI Circuits by Xiao Liu, Qiang Xu |
| title_fullStr | Trace-Based Post-Silicon Validation for VLSI Circuits by Xiao Liu, Qiang Xu |
| title_full_unstemmed | Trace-Based Post-Silicon Validation for VLSI Circuits by Xiao Liu, Qiang Xu |
| title_short | Trace-Based Post-Silicon Validation for VLSI Circuits |
| title_sort | trace based post silicon validation for vlsi circuits |
| topic | Engineering Computer science Systems engineering Circuits and Systems Processor Architectures Semiconductors Informatik Ingenieurwissenschaften |
| topic_facet | Engineering Computer science Systems engineering Circuits and Systems Processor Architectures Semiconductors Informatik Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-3-319-00533-1 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026917053&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=026917053&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
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