Holdings: Design and test technology for dependable systems-on-chip

Design and test technology for dependable systems-on-chip:

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Bibliographic Details
Other Authors:	Ubar, Raimund (Editor), Raik, Jaan 1972- (Editor), Vierhaus, Heinrich Theodor (Editor)
Format:	Electronic eBook
Language:	English
Published:	Hershey PA Information Science Reference [2011]
Series:	Advances in computer and electrical engineering (ACEE) book series Premier reference source
Subjects:	System-on-Chip Aufsatzsammlung
Online Access:	DE-706 DE-1049 DE-898 DE-1050 DE-83 Volltext Volltext
Physical Description:	1 Online-Ressource (xxvi, 550 Seiten) Diagramm
ISBN:	9781609602147 9781621989547

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MARC


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genre_facet	Aufsatzsammlung
id	DE-604.BV041346729
illustrated	Not Illustrated
indexdate	2024-08-23T01:06:29Z
institution	BVB
isbn	9781609602147 9781621989547
language	English
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physical	1 Online-Ressource (xxvi, 550 Seiten) Diagramm
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publishDate	2011
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publisher	Information Science Reference
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series2	Advances in computer and electrical engineering (ACEE) book series Premier reference source
spelling	Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) Hershey PA Information Science Reference [2011] © 2011 1 Online-Ressource (xxvi, 550 Seiten) Diagramm txt rdacontent c rdamedia cr rdacarrier Advances in computer and electrical engineering (ACEE) book series Premier reference source System-on-Chip (DE-588)4740357-3 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content System-on-Chip (DE-588)4740357-3 s DE-604 Ubar, Raimund edt Raik, Jaan 1972- (DE-588)1013864409 edt Vierhaus, Heinrich Theodor edt Erscheint auch als Druck-Ausgabe 978-1-60960-212-3 Erscheint auch als Druck-Ausgabe 1-60960-212-9 http://app.knovel.com/web/toc.v/cid:kpDTTDSC01/viewerType:toc/root_slug:design-test-technology Volltext http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3 Verlag URL des Erstveröffentlichers Volltext
spellingShingle	Design and test technology for dependable systems-on-chip System-on-Chip (DE-588)4740357-3 gnd
subject_GND	(DE-588)4740357-3 (DE-588)4143413-4
title	Design and test technology for dependable systems-on-chip
title_auth	Design and test technology for dependable systems-on-chip
title_exact_search	Design and test technology for dependable systems-on-chip
title_full	Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany)
title_fullStr	Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany)
title_full_unstemmed	Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany)
title_short	Design and test technology for dependable systems-on-chip
title_sort	design and test technology for dependable systems on chip
topic	System-on-Chip (DE-588)4740357-3 gnd
topic_facet	System-on-Chip Aufsatzsammlung
url	http://app.knovel.com/web/toc.v/cid:kpDTTDSC01/viewerType:toc/root_slug:design-test-technology http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3
work_keys_str_mv	AT ubarraimund designandtesttechnologyfordependablesystemsonchip AT raikjaan designandtesttechnologyfordependablesystemsonchip AT vierhausheinrichtheodor designandtesttechnologyfordependablesystemsonchip

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