Design and test technology for dependable systems-on-chip:
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hershey PA
Information Science Reference
[2011]
|
| Schriftenreihe: | Advances in computer and electrical engineering (ACEE) book series
Premier reference source |
| Schlagworte: | |
| Online-Zugang: | DE-706 DE-1049 DE-898 DE-1050 DE-83 Volltext Volltext |
| Beschreibung: | 1 Online-Ressource (xxvi, 550 Seiten) Diagramm |
| ISBN: | 9781609602147 9781621989547 |
Internformat
MARC
| LEADER | 00000nmm a22000002c 4500 | ||
|---|---|---|---|
| 001 | BV041346729 | ||
| 003 | DE-604 | ||
| 005 | 20220209 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 131008s2011 |||| o||u| ||||||eng d | ||
| 020 | |a 9781609602147 |9 978-1-60960-214-7 | ||
| 020 | |a 9781621989547 |9 978-1-62198-954-7 | ||
| 024 | 7 | |a 10.4018/978-1-60960-212-3 |2 doi | |
| 035 | |a (OCoLC)874368714 | ||
| 035 | |a (DE-599)BSZ334844282 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 |a DE-1049 |a DE-898 |a DE-1050 |a DE-83 | ||
| 084 | |a ZN 4904 |0 (DE-625)157419: |2 rvk | ||
| 245 | 1 | 0 | |a Design and test technology for dependable systems-on-chip |c Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) |
| 264 | 1 | |a Hershey PA |b Information Science Reference |c [2011] | |
| 264 | 4 | |c © 2011 | |
| 300 | |a 1 Online-Ressource (xxvi, 550 Seiten) |b Diagramm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in computer and electrical engineering (ACEE) book series | |
| 490 | 0 | |a Premier reference source | |
| 650 | 0 | 7 | |a System-on-Chip |0 (DE-588)4740357-3 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a System-on-Chip |0 (DE-588)4740357-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Ubar, Raimund |4 edt | |
| 700 | 1 | |a Raik, Jaan |d 1972- |0 (DE-588)1013864409 |4 edt | |
| 700 | 1 | |a Vierhaus, Heinrich Theodor |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-1-60960-212-3 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 1-60960-212-9 |
| 856 | 4 | 0 | |u http://app.knovel.com/web/toc.v/cid:kpDTTDSC01/viewerType:toc/root_slug:design-test-technology |3 Volltext |
| 856 | 4 | 0 | |u http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-10-ESC |a ZDB-98-IGB |a ZDB-1-IGE | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-026795388 | |
| 966 | e | |u http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3 |l DE-706 |p ZDB-98-IGB |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.4018/978-1-60960-212-3 |l DE-1049 |p ZDB-1-IGE |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.4018/978-1-60960-212-3 |l DE-898 |p ZDB-1-IGE |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.4018/978-1-60960-212-3 |l DE-1050 |p ZDB-1-IGE |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.4018/978-1-60960-212-3 |l DE-83 |p ZDB-98-IGB |q TUB_EBS_IGB |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1808138438277332992 |
|---|---|
| adam_text | |
| any_adam_object | |
| author2 | Ubar, Raimund Raik, Jaan 1972- Vierhaus, Heinrich Theodor |
| author2_role | edt edt edt |
| author2_variant | r u ru j r jr h t v ht htv |
| author_GND | (DE-588)1013864409 |
| author_facet | Ubar, Raimund Raik, Jaan 1972- Vierhaus, Heinrich Theodor |
| building | Verbundindex |
| bvnumber | BV041346729 |
| classification_rvk | ZN 4904 |
| collection | ZDB-10-ESC ZDB-98-IGB ZDB-1-IGE |
| ctrlnum | (OCoLC)874368714 (DE-599)BSZ334844282 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a22000002c 4500</leader><controlfield tag="001">BV041346729</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220209</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">131008s2011 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781609602147</subfield><subfield code="9">978-1-60960-214-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781621989547</subfield><subfield code="9">978-1-62198-954-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.4018/978-1-60960-212-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)874368714</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BSZ334844282</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield><subfield code="a">DE-1049</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4904</subfield><subfield code="0">(DE-625)157419:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Design and test technology for dependable systems-on-chip</subfield><subfield code="c">Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany)</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hershey PA</subfield><subfield code="b">Information Science Reference</subfield><subfield code="c">[2011]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xxvi, 550 Seiten)</subfield><subfield code="b">Diagramm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advances in computer and electrical engineering (ACEE) book series</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Premier reference source</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">System-on-Chip</subfield><subfield code="0">(DE-588)4740357-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">System-on-Chip</subfield><subfield code="0">(DE-588)4740357-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ubar, Raimund</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Raik, Jaan</subfield><subfield code="d">1972-</subfield><subfield code="0">(DE-588)1013864409</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Vierhaus, Heinrich Theodor</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-1-60960-212-3</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">1-60960-212-9</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://app.knovel.com/web/toc.v/cid:kpDTTDSC01/viewerType:toc/root_slug:design-test-technology</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-10-ESC</subfield><subfield code="a">ZDB-98-IGB</subfield><subfield code="a">ZDB-1-IGE</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-026795388</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-98-IGB</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.4018/978-1-60960-212-3</subfield><subfield code="l">DE-1049</subfield><subfield code="p">ZDB-1-IGE</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.4018/978-1-60960-212-3</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-1-IGE</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.4018/978-1-60960-212-3</subfield><subfield code="l">DE-1050</subfield><subfield code="p">ZDB-1-IGE</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.4018/978-1-60960-212-3</subfield><subfield code="l">DE-83</subfield><subfield code="p">ZDB-98-IGB</subfield><subfield code="q">TUB_EBS_IGB</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV041346729 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-23T01:06:29Z |
| institution | BVB |
| isbn | 9781609602147 9781621989547 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026795388 |
| oclc_num | 874368714 |
| open_access_boolean | |
| owner | DE-706 DE-1049 DE-898 DE-BY-UBR DE-1050 DE-83 |
| owner_facet | DE-706 DE-1049 DE-898 DE-BY-UBR DE-1050 DE-83 |
| physical | 1 Online-Ressource (xxvi, 550 Seiten) Diagramm |
| psigel | ZDB-10-ESC ZDB-98-IGB ZDB-1-IGE ZDB-98-IGB TUB_EBS_IGB |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Information Science Reference |
| record_format | marc |
| series2 | Advances in computer and electrical engineering (ACEE) book series Premier reference source |
| spelling | Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) Hershey PA Information Science Reference [2011] © 2011 1 Online-Ressource (xxvi, 550 Seiten) Diagramm txt rdacontent c rdamedia cr rdacarrier Advances in computer and electrical engineering (ACEE) book series Premier reference source System-on-Chip (DE-588)4740357-3 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content System-on-Chip (DE-588)4740357-3 s DE-604 Ubar, Raimund edt Raik, Jaan 1972- (DE-588)1013864409 edt Vierhaus, Heinrich Theodor edt Erscheint auch als Druck-Ausgabe 978-1-60960-212-3 Erscheint auch als Druck-Ausgabe 1-60960-212-9 http://app.knovel.com/web/toc.v/cid:kpDTTDSC01/viewerType:toc/root_slug:design-test-technology Volltext http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Design and test technology for dependable systems-on-chip System-on-Chip (DE-588)4740357-3 gnd |
| subject_GND | (DE-588)4740357-3 (DE-588)4143413-4 |
| title | Design and test technology for dependable systems-on-chip |
| title_auth | Design and test technology for dependable systems-on-chip |
| title_exact_search | Design and test technology for dependable systems-on-chip |
| title_full | Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) |
| title_fullStr | Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) |
| title_full_unstemmed | Design and test technology for dependable systems-on-chip Raimund Ubar (Tallinn University of Technology, Estonia), Jaan Raik (Tallinn University of Technology, Estonia), Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) |
| title_short | Design and test technology for dependable systems-on-chip |
| title_sort | design and test technology for dependable systems on chip |
| topic | System-on-Chip (DE-588)4740357-3 gnd |
| topic_facet | System-on-Chip Aufsatzsammlung |
| url | http://app.knovel.com/web/toc.v/cid:kpDTTDSC01/viewerType:toc/root_slug:design-test-technology http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-212-3 |
| work_keys_str_mv | AT ubarraimund designandtesttechnologyfordependablesystemsonchip AT raikjaan designandtesttechnologyfordependablesystemsonchip AT vierhausheinrichtheodor designandtesttechnologyfordependablesystemsonchip |