X-ray tomography in industrial metrology: precise, economical and universal
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Bibliographic Details
Main Authors: Christoph, Ralf (Author), Neumann, Hans Joachim 1932- (Author)
Format: Book
Language:English
German
Published: [Landsberg/Lech] Verl. Moderne Industrie 2011
Subjects:
Online Access:Inhaltsverzeichnis
Item Description:Literaturangaben
Physical Description:94 S. Ill., graph. Darst. 19 cm, 170 g
ISBN:9783862360451
9783862360208

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