Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
[Berlin]
Beuth
2008
|
| Schlagworte: | |
| Beschreibung: | 14 S. graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV041210466 | ||
| 003 | DE-604 | ||
| 005 | 20130812 | ||
| 007 | t | ||
| 008 | 130808s2008 d||| |||| 00||| eng d | ||
| 024 | 8 | |a F76-08 | |
| 035 | |a (OCoLC)856870377 | ||
| 035 | |a (DE-599)BVBBV041210466 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 084 | |a ZG 9170 |0 (DE-625)156039: |2 rvk | ||
| 245 | 1 | 0 | |a Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors |c ASTM International |
| 246 | 1 | 3 | |a F76-08 |
| 264 | 1 | |a [Berlin] |b Beuth |c 2008 | |
| 300 | |a 14 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 610 | 2 | 7 | |a ASTM International |0 (DE-588)10033348-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hall-Effekt |0 (DE-588)4023028-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Widerstandsmessung |0 (DE-588)4189810-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Norm |0 (DE-588)4419668-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Norm |0 (DE-588)4419668-4 |D s |
| 689 | 0 | 1 | |a ASTM International |0 (DE-588)10033348-5 |D b |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Norm |0 (DE-588)4419668-4 |D s |
| 689 | 1 | 1 | |a Hall-Effekt |0 (DE-588)4023028-4 |D s |
| 689 | 1 | 2 | |a Widerstandsmessung |0 (DE-588)4189810-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-026185178 | ||
Datensatz im Suchindex
| _version_ | 1804150642050072576 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV041210466 |
| classification_rvk | ZG 9170 |
| ctrlnum | (OCoLC)856870377 (DE-599)BVBBV041210466 |
| discipline | Technik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01347nam a2200397 c 4500</leader><controlfield tag="001">BV041210466</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130812 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">130808s2008 d||| |||| 00||| eng d</controlfield><datafield tag="024" ind1="8" ind2=" "><subfield code="a">F76-08</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)856870377</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041210466</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZG 9170</subfield><subfield code="0">(DE-625)156039:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors</subfield><subfield code="c">ASTM International</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">F76-08</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Berlin]</subfield><subfield code="b">Beuth</subfield><subfield code="c">2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">14 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="610" ind1="2" ind2="7"><subfield code="a">ASTM International</subfield><subfield code="0">(DE-588)10033348-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hall-Effekt</subfield><subfield code="0">(DE-588)4023028-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Widerstandsmessung</subfield><subfield code="0">(DE-588)4189810-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Norm</subfield><subfield code="0">(DE-588)4419668-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Norm</subfield><subfield code="0">(DE-588)4419668-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">ASTM International</subfield><subfield code="0">(DE-588)10033348-5</subfield><subfield code="D">b</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Norm</subfield><subfield code="0">(DE-588)4419668-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Hall-Effekt</subfield><subfield code="0">(DE-588)4023028-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Widerstandsmessung</subfield><subfield code="0">(DE-588)4189810-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-026185178</subfield></datafield></record></collection> |
| id | DE-604.BV041210466 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:42:10Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026185178 |
| oclc_num | 856870377 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | 14 S. graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Beuth |
| record_format | marc |
| spelling | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors ASTM International F76-08 [Berlin] Beuth 2008 14 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier ASTM International (DE-588)10033348-5 gnd rswk-swf Hall-Effekt (DE-588)4023028-4 gnd rswk-swf Widerstandsmessung (DE-588)4189810-2 gnd rswk-swf Norm (DE-588)4419668-4 gnd rswk-swf Norm (DE-588)4419668-4 s ASTM International (DE-588)10033348-5 b DE-604 Hall-Effekt (DE-588)4023028-4 s Widerstandsmessung (DE-588)4189810-2 s |
| spellingShingle | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors ASTM International (DE-588)10033348-5 gnd Hall-Effekt (DE-588)4023028-4 gnd Widerstandsmessung (DE-588)4189810-2 gnd Norm (DE-588)4419668-4 gnd |
| subject_GND | (DE-588)10033348-5 (DE-588)4023028-4 (DE-588)4189810-2 (DE-588)4419668-4 |
| title | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors |
| title_alt | F76-08 |
| title_auth | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors |
| title_exact_search | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors |
| title_full | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors ASTM International |
| title_fullStr | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors ASTM International |
| title_full_unstemmed | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors ASTM International |
| title_short | Standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors |
| title_sort | standard test methods for measuring resistivity and hall coefficient and determining hall mobility in single crystal semiconductors |
| topic | ASTM International (DE-588)10033348-5 gnd Hall-Effekt (DE-588)4023028-4 gnd Widerstandsmessung (DE-588)4189810-2 gnd Norm (DE-588)4419668-4 gnd |
| topic_facet | ASTM International Hall-Effekt Widerstandsmessung Norm |