APA (7th ed.) Citation

Tan, C. M. (2013). Electromigration modeling at circuit layout level. Springer. https://doi.org/10.1007/978-981-4451-21-5

Chicago Style (17th ed.) Citation

Tan, Cher Ming. Electromigration Modeling at Circuit Layout Level. Singapore[u.a.]: Springer, 2013. https://doi.org/10.1007/978-981-4451-21-5.

MLA (9th ed.) Citation

Tan, Cher Ming. Electromigration Modeling at Circuit Layout Level. Springer, 2013. https://doi.org/10.1007/978-981-4451-21-5.