Ellipsometry at the nanoscale:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2013
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| Schlagworte: | |
| Online-Zugang: | BTU01 FHA01 FHI01 FHN01 FHR01 FKE01 FWS01 UBY01 Volltext Inhaltsverzeichnis Abstract |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9783642339561 |
| DOI: | 10.1007/978-3-642-33956-1 |
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| adam_text | ELLIPSOMETRY AT THE NANOSCALE
/
: 2013
TABLE OF CONTENTS / INHALTSVERZEICHNIS
PREAMBLE
PREFACE
A BRIEF HISTORY AND STATE OF THE ART OF ELLIPSOMETRY.-ADVANCED MUELLER
ELLIPSOMETRY INSTRUMENTATION AND DATA ANALYSIS
DATA ANALYSIS FOR NANOMATERIALS: EFFECTIVE MEDIUM APPROXIMATION, ITS
LIMITS AND IMPLEMENTATIONS
RELATIONSHIP BETWEEN SURFACE MORPHOLOGY AND EFFECTIVE MEDIUM ROUGHNESS
PLASMONICS AND EFFECTIVE-MEDIUM THEORY
THIN FILMS OF NANOSTRUCTURED PLASMONIC NOBLE METALS.- SPECTROSCOPIC
ELLIPSOMETRY ON METALLIC GRATINGS
MUELLER MATRIX APPLIED TO NANOSTRUCTURES
SPECTROSCOPIC ELLIPSOMETRY AND MAGNETO-OPTICAL KERR SPECTROSCOPY OF
MAGNETIC GARNET THIN FILMS INCORPORATING PLASMONIC NANOPARTICLES
GENERALIZED ELLIPSOMETRY CHARACTERIZATION OF SCULPTURED THIN FILMS MADE
BY GLANCING ANGLE DEPOSITION
THZ GENERALIZED ELLIPSOMETRY CHARACTERIZATION OF HIGHLY-ORDERED
3-DIMENSIONAL NANOSTRUCTURES
INFRARED ELLIPSOMETRIC INVESTIGATIONS OF FREE CARRIERS AND LATTICE
VIBRATIONS IN SUPERCONDUCTING CUPRATES
REAL-TIME ELLIPSOMETRY FOR PROBING CHARGE-TRANSFER PROCESSES AT THE
NANOSCALE
POLARIMETRIC AND OTHER OPTICAL PROBES FOR THE SOLID - LIQUID INTERFACE
SPECTROSCOPIC ELLIPSOMETRY FOR FUNCTIONAL NANO-LAYERS OF FLEXIBLE
ORGANIC ELECTRONIC DEVICES
SPECTROSCOPIC ELLIPSOMETRY OF NANOSCALE MATERIALS FOR SEMICONDUCTOR
DEVICE APPLICATIONS
ELLIPSOMETRY OF SEMICONDUCTOR NANOCRYSTALS
SPECTROSCOPIC ELLIPSOMETRY FOR INLINE PROCESS CONTROL IN THE
SEMICONDUCTOR INDUSTRY
THIN FILM APPLICATIONS IN RESEARCH AND INDUSTRY CHARACTERIZED BY
SPECTROSCOPIC ELLIPSOMETRY
ELLIPSOMETRY AND CORRELATION MEASUREMENTS
NANOTECHNOLOGY: APPLICATIONS AND MARKETS, PRESENT AND FUTURE
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
ELLIPSOMETRY AT THE NANOSCALE
/
: 2013
ABSTRACT / INHALTSTEXT
THIS BOOK PRESENTS AND INTRODUCES ELLIPSOMETRY IN NANOSCIENCE AND
NANOTECHNOLOGY MAKING A BRIDGE BETWEEN THE CLASSICAL AND NANOSCALE
OPTICAL BEHAVIOUR OF MATERIALS. IT DELINEATES THE ROLE OF THE
NON-DESTRUCTIVE AND NON-INVASIVE OPTICAL DIAGNOSTICS OF ELLIPSOMETRY IN
IMPROVING SCIENCE AND TECHNOLOGY OF NANOMATERIALS AND RELATED PROCESSES
BY ILLUSTRATING ITS EXPLOITATION, RANGING FROM FUNDAMENTAL STUDIES OF
THE PHYSICS AND CHEMISTRY OF NANOSTRUCTURES TO THE ULTIMATE GOAL OF
TURNKEY MANUFACTURING CONTROL. THIS BOOK IS WRITTEN FOR A BROAD
READERSHIP: MATERIALS SCIENTISTS, RESEARCHERS, ENGINEERS, AS WELL AS
STUDENTS AND NANOTECHNOLOGY OPERATORS WHO WANT TO DEEPEN THEIR KNOWLEDGE
ABOUT BOTH BASICS AND APPLICATIONS OF ELLIPSOMETRY TO NANOSCALE
PHENOMENA. IT STARTS AS A GENERAL INTRODUCTION FOR PEOPLE CURIOUS TO
ENTER THE FIELDS OF ELLIPSOMETRY AND POLARIMETRY APPLIED TO
NANOMATERIALS AND PROGRESSES TO ARTICLES BY EXPERTS ON SPECIFIC FIELDS
THAT SPAN FROM PLASMONICS, OPTICS, TO SEMICONDUCTORS AND FLEXIBLE
ELECTRONICS. THE CORE BELIEF REFLECTED IN THIS BOOK IS THAT ELLIPSOMETRY
APPLIED AT THE NANOSCALE OFFERS NEW WAYS OF ADDRESSING MANY CURRENT
NEEDS. THE BOOK ALSO EXPLORES FORWARD-LOOKING POTENTIAL APPLICATIONS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
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| spellingShingle | Ellipsometry at the nanoscale Ingenieurwissenschaften Nanotechnology Surfaces (Physics) Engineering Ellipsometrie (DE-588)4152025-7 gnd Nanostrukturiertes Material (DE-588)4342626-8 gnd |
| subject_GND | (DE-588)4152025-7 (DE-588)4342626-8 (DE-588)4143413-4 |
| title | Ellipsometry at the nanoscale |
| title_auth | Ellipsometry at the nanoscale |
| title_exact_search | Ellipsometry at the nanoscale |
| title_full | Ellipsometry at the nanoscale Maria Losurdo ..., eds. |
| title_fullStr | Ellipsometry at the nanoscale Maria Losurdo ..., eds. |
| title_full_unstemmed | Ellipsometry at the nanoscale Maria Losurdo ..., eds. |
| title_short | Ellipsometry at the nanoscale |
| title_sort | ellipsometry at the nanoscale |
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| topic_facet | Ingenieurwissenschaften Nanotechnology Surfaces (Physics) Engineering Ellipsometrie Nanostrukturiertes Material Aufsatzsammlung |
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