Nanometer variation-tolerant SRAM: circuits and statistical design for yield
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Bibliographic Details
Main Author: Abu-Rahma, Mohamed H. (Author)
Format: Electronic eBook
Language:English
Published: New York Springer c2013
Subjects:
Online Access:Volltext
Item Description:Includes bibliographical references and index
Physical Description:1 Online-Ressource (170 p.)
ISBN:9781461417491
146141749X
9781283640183

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