Nanometer variation-tolerant SRAM: circuits and statistical design for yield
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Springer
c2013
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (170 p.) |
| ISBN: | 9781461417491 146141749X 9781283640183 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV041057103 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 130529s2013 |||| o||u| ||||||eng d | ||
| 020 | |a 9781461417491 |c electronic bk. |9 978-1-4614-1749-1 | ||
| 020 | |a 146141749X |c electronic bk. |9 1-4614-1749-X | ||
| 020 | |a 9781283640183 |c MyiLibrary |9 978-1-283-64018-3 | ||
| 035 | |a (OCoLC)812017268 | ||
| 035 | |a (DE-599)BVBBV041057103 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.39/73 |2 23 | |
| 100 | 1 | |a Abu-Rahma, Mohamed H. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Nanometer variation-tolerant SRAM |b circuits and statistical design for yield |c Mohamed H. Abu-Rahma, Mohab Anis |
| 264 | 1 | |a New York |b Springer |c c2013 | |
| 300 | |a 1 Online-Ressource (170 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Random access memory | |
| 700 | 1 | |a Anis, Mohab |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 978-1-4614-1748-4 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 1-4614-1748-1 |
| 856 | 4 | 0 | |u http://lib.myilibrary.com/detail.asp?id=395268 |x Verlag |3 Volltext |
| 912 | |a ZDB-26-MYL | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028412290 | ||
Datensatz im Suchindex
| _version_ | 1804175324305424384 |
|---|---|
| any_adam_object | |
| author | Abu-Rahma, Mohamed H. |
| author_facet | Abu-Rahma, Mohamed H. |
| author_role | aut |
| author_sort | Abu-Rahma, Mohamed H. |
| author_variant | m h a r mha mhar |
| building | Verbundindex |
| bvnumber | BV041057103 |
| collection | ZDB-26-MYL |
| ctrlnum | (OCoLC)812017268 (DE-599)BVBBV041057103 |
| dewey-full | 621.39/73 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/73 |
| dewey-search | 621.39/73 |
| dewey-sort | 3621.39 273 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01335nmm a2200361zc 4500</leader><controlfield tag="001">BV041057103</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">130529s2013 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781461417491</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-4614-1749-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">146141749X</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">1-4614-1749-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781283640183</subfield><subfield code="c">MyiLibrary</subfield><subfield code="9">978-1-283-64018-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)812017268</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041057103</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/73</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Abu-Rahma, Mohamed H.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Nanometer variation-tolerant SRAM</subfield><subfield code="b">circuits and statistical design for yield</subfield><subfield code="c">Mohamed H. Abu-Rahma, Mohab Anis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Springer</subfield><subfield code="c">c2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (170 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Random access memory</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Anis, Mohab</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-1-4614-1748-4</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">1-4614-1748-1</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://lib.myilibrary.com/detail.asp?id=395268</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-26-MYL</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028412290</subfield></datafield></record></collection> |
| id | DE-604.BV041057103 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:14:29Z |
| institution | BVB |
| isbn | 9781461417491 146141749X 9781283640183 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028412290 |
| oclc_num | 812017268 |
| open_access_boolean | |
| physical | 1 Online-Ressource (170 p.) |
| psigel | ZDB-26-MYL |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Springer |
| record_format | marc |
| spelling | Abu-Rahma, Mohamed H. Verfasser aut Nanometer variation-tolerant SRAM circuits and statistical design for yield Mohamed H. Abu-Rahma, Mohab Anis New York Springer c2013 1 Online-Ressource (170 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Random access memory Anis, Mohab Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-1-4614-1748-4 Erscheint auch als Druck-Ausgabe, Hardcover 1-4614-1748-1 http://lib.myilibrary.com/detail.asp?id=395268 Verlag Volltext |
| spellingShingle | Abu-Rahma, Mohamed H. Nanometer variation-tolerant SRAM circuits and statistical design for yield Random access memory |
| title | Nanometer variation-tolerant SRAM circuits and statistical design for yield |
| title_auth | Nanometer variation-tolerant SRAM circuits and statistical design for yield |
| title_exact_search | Nanometer variation-tolerant SRAM circuits and statistical design for yield |
| title_full | Nanometer variation-tolerant SRAM circuits and statistical design for yield Mohamed H. Abu-Rahma, Mohab Anis |
| title_fullStr | Nanometer variation-tolerant SRAM circuits and statistical design for yield Mohamed H. Abu-Rahma, Mohab Anis |
| title_full_unstemmed | Nanometer variation-tolerant SRAM circuits and statistical design for yield Mohamed H. Abu-Rahma, Mohab Anis |
| title_short | Nanometer variation-tolerant SRAM |
| title_sort | nanometer variation tolerant sram circuits and statistical design for yield |
| title_sub | circuits and statistical design for yield |
| topic | Random access memory |
| topic_facet | Random access memory |
| url | http://lib.myilibrary.com/detail.asp?id=395268 |
| work_keys_str_mv | AT aburahmamohamedh nanometervariationtolerantsramcircuitsandstatisticaldesignforyield AT anismohab nanometervariationtolerantsramcircuitsandstatisticaldesignforyield |