Analog IC reliability in nanometer CMOS:
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Springer
2013
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| Schriftenreihe: | Analog circuits and signal processing
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| Schlagworte: | |
| Online-Zugang: | BTU01 FHA01 FHI01 FHN01 FHR01 FKE01 FWS01 UBY01 Volltext Inhaltsverzeichnis Abstract |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9781461461630 |
| DOI: | 10.1007/978-1-4614-6163-0 |
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Datensatz im Suchindex
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| adam_text | ANALOG IC RELIABILITY IN NANOMETER CMOS
/ MARICAU, ELIE
: 2013
TABLE OF CONTENTS / INHALTSVERZEICHNIS
INTRODUCTION
CMOS RELIABILITY OVERVIEW
TRANSISTOR AGING COMPACT MODELING
BACKGROUND ON IC RELIABILITY SIMULATION
ANALOG IC RELIABILITY SIMULATION
INTEGRATED CIRCUIT RELIABILITY
CONCLUSIONS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
ANALOG IC RELIABILITY IN NANOMETER CMOS
/ MARICAU, ELIE
: 2013
ABSTRACT / INHALTSTEXT
THIS BOOK FOCUSES ON MODELING, SIMULATION AND ANALYSIS OF ANALOG CIRCUIT
AGING. FIRST, ALL IMPORTANT NANOMETER CMOS PHYSICAL EFFECTS RESULTING IN
CIRCUIT UNRELIABILITY ARE REVIEWED. THEN, TRANSISTOR AGING COMPACT
MODELS FOR CIRCUIT SIMULATION ARE DISCUSSED AND SEVERAL METHODS FOR
EFFICIENT CIRCUIT RELIABILITY SIMULATION ARE EXPLAINED AND COMPARED.
ULTIMATELY, THE IMPACT OF TRANSISTOR AGING ON ANALOG CIRCUITS IS
STUDIED. AGING-RESILIENT AND AGING-IMMUNE CIRCUITS ARE IDENTIFIED AND
THE IMPACT OF TECHNOLOGY SCALING IS DISCUSSED. THE MODELS AND
SIMULATION TECHNIQUES DESCRIBED IN THE BOOK ARE INTENDED AS AN AID FOR
DEVICE ENGINEERS, CIRCUIT DESIGNERS AND THE EDA COMMUNITY TO UNDERSTAND
AND TO MITIGATE THE IMPACT OF AGING EFFECTS ON NANOMETER CMOS ICS.
ENABLES READERS TO UNDERSTAND LONG-TERM RELIABILITY
OF AN INTEGRATED CIRCUIT; REVIEWS CMOS UNRELIABILITY
EFFECTS, WITH FOCUS ON THOSE THAT WILL EMERGE IN FUTURE CMOS NODES;
PROVIDES OVERVIEW OF MODELS FOR KEY AGING EFFECTS, AS
WELL AS COMPACT MODELS THAT CAN BE INCLUDED IN A CIRCUIT SIMULATOR, WITH
MODEL PARAMETERS FOR ADVANCED CMOS TECHNOLOGY;
DESCRIBES EXISTING RELIABILITY SIMULATORS, ALONG WITH TECHNIQUES TO
ANALYZE THE IMPACT OF PROCESS VARIATIONS AND AGING ON AN ARBITRARY
ANALOG CIRCUIT
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-4614-6163-0 |
| format | Electronic eBook |
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| id | DE-604.BV041043365 |
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| indexdate | 2024-08-01T16:14:46Z |
| institution | BVB |
| isbn | 9781461461630 |
| language | English |
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| record_format | marc |
| series2 | Analog circuits and signal processing |
| spellingShingle | Maricau, Elie Analog IC reliability in nanometer CMOS Ingenieurwissenschaften Electronics Systems engineering Engineering |
| title | Analog IC reliability in nanometer CMOS |
| title_auth | Analog IC reliability in nanometer CMOS |
| title_exact_search | Analog IC reliability in nanometer CMOS |
| title_full | Analog IC reliability in nanometer CMOS Elie Maricau ; Georges Gielen |
| title_fullStr | Analog IC reliability in nanometer CMOS Elie Maricau ; Georges Gielen |
| title_full_unstemmed | Analog IC reliability in nanometer CMOS Elie Maricau ; Georges Gielen |
| title_short | Analog IC reliability in nanometer CMOS |
| title_sort | analog ic reliability in nanometer cmos |
| topic | Ingenieurwissenschaften Electronics Systems engineering Engineering |
| topic_facet | Ingenieurwissenschaften Electronics Systems engineering Engineering |
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