Ellipsometry at the nanoscale:
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Bibliographic Details
Other Authors: Losurdo, Maria (Editor)
Format: Book
Language:English
Published: Berlin [u.a.] Springer 2013
Subjects:
Online Access:Inhaltstext
Inhaltsverzeichnis
Physical Description:XXIV, 730 S. 235 mm x 155 mm
ISBN:9783642339554
3642339557

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