Ellipsometry at the nanoscale:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2013
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| Schlagworte: | |
| Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
| Beschreibung: | XXIV, 730 S. 235 mm x 155 mm |
| ISBN: | 9783642339554 3642339557 |
Internformat
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Datensatz im Suchindex
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|---|---|
| adam_text |
IMAGE 1
CONTENTS
1 A BRIEF HISTORY AND STATE OF THE ART O F ELLIPSOMETRY 1
EUGENE A. IRENE
2 ADVANCED MUELLER ELLIPSOMETRY INSTRUMENTATION AND DATA ANALYSIS 31
ENRIC GARCIA-CAUREL, RAZVIGOR OSSIKOVSKI, MARTIN FOLDYNA, ANGELO
PIERANGELO, BERNARD DREVILLON AND ANTONELLO D E MARTINO
3 DATA ANALYSIS FOR NANOMATERIALS: EFFECTIVE MEDIUM APPROXIMATION, ITS
LIMITS AND IMPLEMENTATIONS 145
JOSEF HUMLICEK
4 RELATIONSHIP BETWEEN SURFACE MORPHOLOGY AND EFFECTIVE MEDIUM ROUGHNESS
179
ANGEL YANGUAS-GIL AND HERBERT WORMEESTER
5 PLASMONICS AND EFFECTIVE-MEDIUM THEORY 203
DAVID E. ASPNES
6 THIN FILMS OF NANOSTRUCTURED NOBLE METALS 225
HERBERT WORMEESTER AND THOMAS W. H. OATES
7 SPECTROSCOPIC ELLIPSOMETRY ON METALLIC GRATINGS 257
MICHAEL BERGMAIR, KURT HINGERL AND PETER ZEPPENFELD
8 ELLIPSOMETRY AT THE NANOSTRUCTURE 313
YASUHIRO MIZUTANI AND YUKITOSHI OTANI
HTTP://D-NB.INFO/1025943597
IMAGE 2
XVIII C O N T E N T S
9 SPECTROSCOPIC ELLIPSOMETRY AND MAGNETO-OPTICAL KERR
SPECTROSCOPY OF MAGNETIC GARNET THIN FILMS INCORPORATING PLASMONIC
NANOPARTICLES 325
SATOSHI TOMITA
10 GENERALIZED ELLIPSOMETRY CHARACTERIZATION OF SCULPTURED THIN FILMS
MADE BY GLANCING ANGLE DEPOSITION 341
DANIEL SCHMIDT, EVA SCHUBERT AND MATHIAS SCHUBERT
11 THZ GENERALIZED ELLIPSOMETRY CHARACTERIZATION OF HIGHLY-ORDERED
THREE-DIMENSIONAL NANOSTRUCTURES 411 TINO HOFMANN, DANIEL SCHMIDT AND
MATHIAS SCHUBERT
12 INFRARED ELLIPSOMETRIC INVESTIGATIONS OF FREE CARRIERS AND LATTICE
VIBRATIONS IN SUPERCONDUCTING CUPRATES 429
JIN CHALOUPKA, DOMINIK MUNZAR AND JOSEF HUMLFCEK
13 REAL-TIME ELLIPSOMETRY FOR PROBING CHARGE-TRANSFER PROCESSES AT THE
NANOSCALE 453
MARIA LOSURDO, APRIL S. BROWN AND GIOVANNI BRUNO
14 POLARIMETRIC AND OTHER OPTICAL PROBES FOR THE SOLID-LIQUID INTERFACE
493
KURT HINGERL
15 SPECTROSCOPIC ELLIPSOMETRY FOR FUNCTIONAL NANO-LAYERS OF FLEXIBLE
ORGANIC ELECTRONIC DEVICES 529
STERGIOS LOGOTHETIDIS AND ARGIRIS LASKARAKIS
16 SPECTROSCOPIC ELLIPSOMETRY O F NANOSCALE MATERIALS FOR SEMICONDUCTOR
DEVICE APPLICATIONS 557
ALAIN C. DIEBOLD, FLORENCE J. NELSON AND VIMAL K. KAMINENI
17 ELLIPSOMETRY OF SEMICONDUCTOR NANOCRYSTALS 583
PETER PETRIK AND MIKLOS FRIED
18 SPECTROSCOPIC ELLIPSOMETRY FOR INLINE PROCESS CONTROL IN THE
SEMICONDUCTOR INDUSTRY 607
STEFAN ZOLLNER
19 THIN FILM APPLICATIONS IN RESEARCH AND INDUSTRY CHARACTERIZED BY
SPECTROSCOPIC ELLIPSOMETRY 629
DENIS CATTELAN, CELINE EYPERT, M A R Z O U K KLOUL, MELANIE GAILLET,
JEAN-PAUL GASTON, ROLAND SEITZ, ASSIA SHAGALEEVA AND MICHEL STCHAKOVSKY
IMAGE 3
C O N T E N T S X I X
20 ELLIPSOMETRY AND CORRELATION MEASUREMENTS 669
RADOS GAJIC AND MILKA JAKOVLJEVIC
21 NANOTECHNOLOGY: APPLICATIONS AND MARKETS, PRESENT AND FUTURE 705
OTTILIA SAXL |
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| isbn | 9783642339554 3642339557 |
| language | English |
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| physical | XXIV, 730 S. 235 mm x 155 mm |
| publishDate | 2013 |
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| spelling | Ellipsometry at the nanoscale Berlin [u.a.] Springer 2013 XXIV, 730 S. 235 mm x 155 mm txt rdacontent n rdamedia nc rdacarrier Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf Ellipsometrie (DE-588)4152025-7 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Nanostrukturiertes Material (DE-588)4342626-8 s Ellipsometrie (DE-588)4152025-7 s DE-604 Losurdo, Maria edt X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=4121573&prov=M&dok_var=1&dok_ext=htm Inhaltstext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025937151&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Ellipsometry at the nanoscale Nanostrukturiertes Material (DE-588)4342626-8 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| subject_GND | (DE-588)4342626-8 (DE-588)4152025-7 (DE-588)4143413-4 |
| title | Ellipsometry at the nanoscale |
| title_auth | Ellipsometry at the nanoscale |
| title_exact_search | Ellipsometry at the nanoscale |
| title_full | Ellipsometry at the nanoscale |
| title_fullStr | Ellipsometry at the nanoscale |
| title_full_unstemmed | Ellipsometry at the nanoscale |
| title_short | Ellipsometry at the nanoscale |
| title_sort | ellipsometry at the nanoscale |
| topic | Nanostrukturiertes Material (DE-588)4342626-8 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| topic_facet | Nanostrukturiertes Material Ellipsometrie Aufsatzsammlung |
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