Characterization of semiconductor heterostructures and nanostructures:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2013
|
| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Klappentext |
| Beschreibung: | Previous ed.: 2008 Includes bibliographical references and index |
| Beschreibung: | XIII, 813 S. Ill., graph. Darst. |
| ISBN: | 9780444595515 0444595511 |
Internformat
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| 245 | 1 | 0 | |a Characterization of semiconductor heterostructures and nanostructures |c ed. by Carlo Lamberti ... |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2013 | |
| 300 | |a XIII, 813 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 500 | |a Previous ed.: 2008 | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Semiconductors / Characterization | |
| 650 | 4 | |a Heterostructures | |
| 650 | 4 | |a Nanostructures | |
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Datensatz im Suchindex
| _version_ | 1804150175766151168 |
|---|---|
| adam_text | Preface
¡χ
Contributors
x¡
1.
Introduction: The Interdisciplinary Nature of and Nanotechnology
and Its Need to Exploit Frontier Characterization Techniques
1
Giovanni Agostini,
Carlo
Lamberti
2.
Ab initio
Studies of Structural and Electronic Properties
21
Maria Peressi, Alfonso Baldereschi
3.
Strain and Composition Determination in Semiconductor Heterostructures
by High-Resolution X-ray Diffraction
75
Claudio
Ferrari,
Elisa Buffagni,
Francesca Rossi
4.
Nanostructures Observed by Surface Sensitive
Х
-Ray Scattering
and Highly Focused Beams
113
Tobias Schülli,
Vincent
Favre-Nicolin, Marie-Ingrid
Richard,
Gilles Renaud
5.
Small-Angle X-ray Scattering for the Study of Nanostructures and
Nanostructured Materials
175
Giuseppe Portale, Alessandro
Longo
6.
Local Structure of Bulk and Nanocrystalline Semiconductors
Using Total Scattering Methods
229
Emil S. Božin, Pavol Juhás,
Simon J.L Billinge
7.
Х
-Ray
Absorption
Fine Structure
in
the Study of Semiconductor
Heterostructures and Nanostructures
259
F.
Boscherini
8.
Grazing Incidence Diffraction Anomalous Fine Structure in the Study
of Structural Properties of Nanostructures
311
H.
Renevier, M.G.
Proietti
9.
Micro- and Nano-X-ray Beams
361
Gema Martinez-Criado, Elisa Borfecchia,
Lorenzo
Mino,
Carlo
Lamberti
10.
Transmission Electron Microscopy Techniques for Imaging and
Compositional Evaluation in Semiconductor Heterostructures
413
Laura Lazzarini, Lucia
Nasi, Vincenzo Grillo
vu
viii Contents
11.
Imaging at the Nanoscale: Scanning Probe Microscopies Applied
to Semiconductors
467
Chiara Manfredotti
12.
Photoluminescence Characterization of Structural and Electronic
Properties of Semiconductor Quantum Wells
509
S. Sanguinetti, M.
Guzzi, E. Gatti,
M.
Gurioli
13.
Cathodoluminescence
of
Selfassembled Nanosystems: The Cases
of
Tetrapods, Nanowires, and Nanocrystals
557
Giancarlo Salviati, Filippo Fabbri, Francesca Detto, Francesca Rossi,
Laura Lazzarini, Takashi Sekiguchi
14.
The Role of
Photoemission
Spectroscopies in Heterojunction Research
603
G. Margaritondo
15.
Electrical and Electro-Optical Characterization of Semiconductor Nanowires
641
Lorenzo Rigutti, Maria Tchernycheva
16.
Electron Spin Resonance of Interfaces and Nanolayers in Semiconductor
Heterostructures
685
Andre Stesmans,
Valéry
V. Afanas ev
17.
Raman Spectroscopy
753
Daniel Wolverson
Index
803
Characterization
of Semiconductor Heterostructures and Nanostructures
2nd
edition reviews
the theory and presents real-life examples of methods used to analyse the structural, physical,
chemical, electronic, optical and electrical properties of nanometer-scale structures and materials.
These methods are increasingly important due to the demand for high-performance electronic
and optoelectronic devices.
Each chapter provides an educational introduction, reviewing the basic concepts of key analytical
and spectroscopy techniques written in an approach understandable by advanced students in
Physics, Chemistry, Material Science, Engineering and Nanotechnology.
ch chapter presents a selected set of examples from the recent literature
chnique, so that you can understand how these methods are actually used
that illustrates eac
in practice.
Key features:
•
Comprehensive collection of the most powerful characterization techniques for semiconductor
structures and nanostructures
•
After introducing each technique, applications illustrating the power of the technique to
analyse the properties of nanostructures, are given
• 30%
new material with updates reflecting new advances to analyse nanostructures, and four
new chapters reviewing total scattering; synchroton micro- and nano-beams; small angle X-ray
scattering (SAXS); and atomic force and scanning tunnel microcopies
About the editors:
Carlo
Lamberti
has authored over
250
research articles and letters in Physics, Chemistry and Material
Science. He has written
9
review papers,
б
book chapters and a book Applications of Synchrotron
Radiation . He has performed more than
100
experiments with synchrotron and neutron sources.
Giovanni
Agostini,
Masters in Physics in
2006,
PhD in Materials Science in
2010
from the Torino
University. He actually has a Post-Doc position in the same group. His main research activities include
the structural characterization of nanostructured materials with a multi-technique approach based
on combination ofTEM, XRPD and EXAFS. He also recently started to use SAXS and PDF approaches.
He authored more than
25
research papers,
1
review paper and
1
book chapter.
ISBN
978-0-444-59551-5
ELSEVIER
|
| any_adam_object | 1 |
| author2 | Lamberti, Carlo |
| author2_role | edt |
| author2_variant | c l cl |
| author_facet | Lamberti, Carlo |
| building | Verbundindex |
| bvnumber | BV040892791 |
| classification_rvk | UP 3150 VE 9850 |
| ctrlnum | (OCoLC)843620063 (DE-599)BVBBV040892791 |
| dewey-full | 537.6226 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6226 |
| dewey-search | 537.6226 |
| dewey-sort | 3537.6226 |
| dewey-tens | 530 - Physics |
| discipline | Chemie / Pharmazie Physik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV040892791 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T00:34:45Z |
| institution | BVB |
| isbn | 9780444595515 0444595511 |
| language | English |
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| physical | XIII, 813 S. Ill., graph. Darst. |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Elsevier |
| record_format | marc |
| spelling | Characterization of semiconductor heterostructures and nanostructures ed. by Carlo Lamberti ... 2. ed. Amsterdam [u.a.] Elsevier 2013 XIII, 813 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Previous ed.: 2008 Includes bibliographical references and index Semiconductors / Characterization Heterostructures Nanostructures Heterostruktur (DE-588)4123378-5 gnd rswk-swf Nanostruktur (DE-588)4204530-7 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Heterostruktur (DE-588)4123378-5 s DE-604 Nanostruktur (DE-588)4204530-7 s Lamberti, Carlo edt Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025872403&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025872403&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Klappentext |
| spellingShingle | Characterization of semiconductor heterostructures and nanostructures Semiconductors / Characterization Heterostructures Nanostructures Heterostruktur (DE-588)4123378-5 gnd Nanostruktur (DE-588)4204530-7 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4123378-5 (DE-588)4204530-7 (DE-588)4022993-2 |
| title | Characterization of semiconductor heterostructures and nanostructures |
| title_auth | Characterization of semiconductor heterostructures and nanostructures |
| title_exact_search | Characterization of semiconductor heterostructures and nanostructures |
| title_full | Characterization of semiconductor heterostructures and nanostructures ed. by Carlo Lamberti ... |
| title_fullStr | Characterization of semiconductor heterostructures and nanostructures ed. by Carlo Lamberti ... |
| title_full_unstemmed | Characterization of semiconductor heterostructures and nanostructures ed. by Carlo Lamberti ... |
| title_short | Characterization of semiconductor heterostructures and nanostructures |
| title_sort | characterization of semiconductor heterostructures and nanostructures |
| topic | Semiconductors / Characterization Heterostructures Nanostructures Heterostruktur (DE-588)4123378-5 gnd Nanostruktur (DE-588)4204530-7 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Semiconductors / Characterization Heterostructures Nanostructures Heterostruktur Nanostruktur Halbleiter |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025872403&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025872403&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
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