ISTFA 2011: conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2011
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xix, 456 p.) |
| ISBN: | 0615038263 9781615038268 9781615038503 |
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| id | DE-604.BV040887406 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T00:34:39Z |
| institution | BVB |
| isbn | 0615038263 9781615038268 9781615038503 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025867108 |
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| publishDate | 2011 |
| publishDateSearch | 2011 |
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| publisher | ASM International |
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| spelling | International Symposium for Testing and Failure Analysis < 2011, San Jose, Calif.> Verfasser aut ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International Materials Park, Ohio ASM International 2011 1 Online-Ressource (xix, 456 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Available via World Wide Web Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth ebrary, Inc Sonstige oth Reproduktion von International Symposium for Testing and Failure Analysis < 2011, San Jose, Calif.>, ISTFA 2011 2011 |
| spellingShingle | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA |
| title_auth | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA |
| title_full | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_fullStr | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_full_unstemmed | ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_short | ISTFA 2011 |
| title_sort | istfa 2011 conference proceedings of the 37th international symposium for testing and failure analysis november 13 17 2011 san jose convention center san jose california usa |
| title_sub | conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA |
| topic | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
| topic_facet | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Konferenzschrift |
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